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Seifert, F., Sharp, T., Poe, B. et al. ELNES Si L-, K-edge and 0 K-edge spectroscopy as a tool for distinction of four- vs. six-coordinated silicon in high-pressure phases. Phys Chem Minerals 23, 227 (1996). https://doi.org/10.1007/BF00207750
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DOI: https://doi.org/10.1007/BF00207750