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Soft magnetic properties of NiFeTa thin films for biasing film applications in magnetoresistive elements

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Abstract

The effects of Ta addition on the magnetic properties of permalloy thin films have been investigated. The alloy compositions on a weight basis are (Ni81Fe19)1-x Ta x with 0 ⩽ x ⩽ 0.105, and the films are sputtered onto a glass substrate at between room temperature and 300 ‡C. The saturation magnetization and anisotropic magnetic field decrease with increasing Ta content. The saturation magnetization is 0.75 T at 5 wt % Ta. The coercivity remains constant at 125 Am-1. The electrical resistivity increases linearly with increasing Ta content, then saturates at approximately 7.5 wt% Ta. The saturation resistivity is approximately 1.00 ΜΩm. The magnetoresistivity ratio (δϱ/ϱ) decreases with increasing Ta content, mainly due to increased electrical resistivity (ϱ). The magnetostriction changes from negative to positive with increasing Ta content and reaches nearly zero at 2 wt% Ta. The NiFeTa films containing 5–6 wt% Ta have potential for use as the soft-biasing film in magnetoresistive elements.

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Kitada, M., Yamamoto, K. Soft magnetic properties of NiFeTa thin films for biasing film applications in magnetoresistive elements. J Mater Sci: Mater Electron 7, 447–449 (1996). https://doi.org/10.1007/BF00180784

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  • DOI: https://doi.org/10.1007/BF00180784

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