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Temperature dependence of electronic relaxation time in the Sondheimer size effect of copper

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Abstract

Measurements of the phonon-limited relaxation time Τ T are made in copper by means of the Sondheimer size effect. It is found that the relaxation rate 1/Τ T varies approximately as T 5 when the magnetic field is directed in the [110] direction, while it varies approximately as T 5 below 8 K and as T 3.3 above 8.5 K when the magnetic field is directed in the [100] direction. The results are discussed in terms of diffusive and catastrophic scattering.

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Authors and Affiliations

  1. Department of Physics, Faculty of Science, Tokyo Metropolitan University, Setagaya-ku, Tokyo, Japan

    I. Sakamoto & T. Sato

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  1. I. Sakamoto
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  2. T. Sato
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This work was supported by Grant-in-Aid for Scientific Research from the Ministry of Education of Japan.

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Sakamoto, I., Sato, T. Temperature dependence of electronic relaxation time in the Sondheimer size effect of copper. J Low Temp Phys 36, 79–88 (1979). https://doi.org/10.1007/BF00174913

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  • DOI: https://doi.org/10.1007/BF00174913

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