Abstract
The morphology of undiffused and iodine-diffused CdTe slices and its effect on iodine concentration profiles is discussed. Such CdTe slices were analysed using defect etching, scanning electron microscopy (SEM), infrared microscopy and secondary ion mass spectrometry (SIMS). The results suggest that during diffusion a layer of an iodine compound forms in the surface region of the CdTe while, over a limited range further into the material, clusters of either this or a similar compound form at defect sites causing a high degree of crystal distortion.
Similar content being viewed by others
References
C. D. MAXEY, P. A. C. WHIFFIN and B.C. EASTON, Semicond. Sci. Technol. 6 (1991) C26.
D. RAJAVEL, B. K. WAGNER, R. G. BENZ II, A. CONTE, K. MARUYAMA, C. L. SUMMERS and J. D. BENSON, J. Vac. Sci. Technol. B10 (1992) 1432.
E. A. GORODETSKII, G. A. KACHURIN and C. S. SMIRNOV, Diffuz. Poluprov. (dy1967) 72.
E. D. JONES, J. MALZBENDER, J. B. MULLIN and N. SHAW, J. Crystal Growth 138 (1994) 279.
E. D. JONES, J. C. CLARK, J. MALZBENDER, J. B. MULLIN, N. SHAW and A. W. BRINKMAN, J. Elec. Mater. 24 (5) (1995) 581.
J. MALZBENDER, E. D. JONES, J. B. MULLIN and N. SHAW, J. Mater. Sci. Mater. Elec. 5 (1994) 352.
R. STICKLER and G. R. BOOKER, Phil. Mag. 8 (1962) 859.
M. INOUE, I. TERAMOTO, S. TAKAYANAGI, J. Appl. Phys. 33 (1962) 2578.
K. NAKAGAWA, K. MAEDA, S. TAKEUCHI, Appl. Phys. Lett. 34 (1979) 574.
L. GMELIN, “Handbuch der Anorganischen Chemie” (Enke Verlag, Stuttgart, 1960).
Y. Y. LOGINOV, P. D. BROWN, K. DUROSE, N. THOMPSON, A. A. ALNAJJAR, A. W. BRINKMAN and J. WOODSET, J. Cryst. Growth 117 (1992) 259.
E. D. JONES and N. M. STEWART, ibid. J. Cryst. Growth 84 (1987) 289.
D. SHAW, Semicond. Sci. Technol. 7 (1992) 1230.
E. D. JONES, J. MALZBENDER, J. B. MULLIN and N. SHAW, J. Phys. C. 6 (1994) 7499.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Malzbender, J., Jones, E.D., Mullin, J.B. et al. Morphological effects and the diffusion of iodine in CdTe. J Mater Sci: Mater Electron 6, 397–403 (1995). https://doi.org/10.1007/BF00144641
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF00144641