Abstract
A finite strain elastic-plastic finite element analysis is performed on a crack which lies on an interface between two dissimilar materials. The materials above and below the interface are assumed to be different from each other in yield stress or in strain-hardening exponent. Gurson's constitutive equation for porous plastic materials is used in order to take into account the effect of the microvoid nucleation and growth on the fields near the tip of a crack.
It is found that the microvoids have larger effects on the crack tip blunting and stress fields for a bimaterial than for a homogeneous material. It is also found that the plastic strain and the microvoid volume fraction localize in a few narrow bands which grow into the softer material from the intersection of the interface and the blunted crack tip at inclinations of about 15° ∼ 45°.
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References
J.R. Rice, Journal of Applied Mechanics 55 (1988) 98–103.
M. Comninou, Journal of Applied Mechanics 44 (1977) 631–636.
C. Atkinson, International Journal of Fracture 13 (1977) 807–820.
A. Mak, L. Keer, C. Chen and J. Lewis. Journal of Applied Mechanics 47 (1980) 347–350.
C.F. Shih and R.J. Asaro, Journal of Applied Mechanics 55 (1988) 299–316.
C.F. Shih, R.J. Asaro and N.P. O'Dowd, Proceedings of Acta/Scripta Metallurgica Conference, University of California, Santa Barbara (1989).
A.L. Gurson, Journal of Engineering Materials Technology 99 (1977) 2–15.
S. Aoki, K. Kishimoto, T. Yoshida and M. Sakata, Journal of Mechanics and Physics of Solids 35 (1987) 431–455.
A. Needleman and J.R. Rice, Mechanics of Steel Metal Forming, D.P. Koistinen and N.M. Wang (eds.) (1978) 237–265.
R.M. McMeeking, Journal of Mechanics and Physics of Solids 25 (1977) 357–381.
S. Aoki, K. Kishimoto, A. Takeya and M. Sakata, International Journal of Fracture 24 (1984) 267–278.
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Aoki, S., Kishimoto, K. & Takeuchi, N. An elastic-plastic finite element analysis of a blunting interface crack with microvoid damage. Int J Fract 55, 363–374 (1992). https://doi.org/10.1007/BF00035191
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DOI: https://doi.org/10.1007/BF00035191