Abstract
The method of determination of v-K-curves by evaluation of lifetime measurements is demonstrated for hot-pressed silicon nitride at temperatures in the range of 1000°C and 1200°C. Restrictions to avoid errors due to extensive creep effects and to assure the applicability of linear stress distributions as well as linear-elastic fracture mechanics are developed.
Résumé
On établit la méthode de détermination des courbes v-K par l'évaluation des mesures d'endurance dans le cas de nitrures de silicium pressé à chaud, aux températures de 1000°C et de 1200°C. On présente les restrictions dont il faut tenir compte pour éviter des erreurs dues à des effets de fluage important et pour permettre l'application de distributions linéaires des contraintes ainsi que de la mécanique de rupture linéaire élastique.
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Fett, T., Keller, K. & Munz, D. Determination of v-K-curves of hot-pressed silicon nitride at elevated temperatures. Int J Fract 36, 3–14 (1988). https://doi.org/10.1007/BF00034813
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DOI: https://doi.org/10.1007/BF00034813