First-Principles Investigations on Structural, Elastic, Electronic, and Optical Properties of Tetragonal HfSiO4
- 193 Downloads
- 3 Citations
Abstract
Structural parameters, elastic, mechanical, electronic, chemical bonding, and optical properties of tetragonal HfSiO4 have been investigated using the plane-wave ultrasoft pseudopotential technique based on the first-principles density-functional theory. The ground-state properties obtained by minimizing the total energy are in agreement with the available experimental and theoretical data. This compound is found to be mechanically stable, and we have obtained the bulk, shear, and Young's modulus; Poisson's coefficient; and Lamé's constants. We have estimated the Debye temperature of tetragonal HfSiO4 from the acoustic velocity. Electronic and chemical bonding properties have been studied. Moreover, the complex dielectric function, refractive index, extinction coefficient, absorption coefficient, energy-loss spectrum, optical reflectivity, and complex conductivity function are calculated and analyzed.
Keywords
Density-functional theory Elastic properties Optical properties Tetragonal HfSiO4Notes
Acknowledgments
This work was financially supported by the Scholarship Award for Excellent Doctoral Student granted by the Ministry of Education, China, the National Natural Science Foundation of China (contract no. 50902110), the Doctorate Foundation of Northwestern Polytechnical University (contract no. cx201005), the 111 Project (contract no. B08040), and the Research Fund of the State Key Laboratory of Solidification Processing (NWPU), China (contract no. 58-TZ-2011).
References
- 1.J. Robertson, Rep. Prog. Phys. 69, 327 (2006)ADSCrossRefGoogle Scholar
- 2.G.D. Wilk, R.M. Wallace, J.M. Anthony, J. Appl. Phys. 89, 5243 (2001)ADSCrossRefGoogle Scholar
- 3.M. Haverty, A. Kawamoto, K. Cho, R. Dutton, Appl. Phys. Lett. 80, 2669 (2002)ADSCrossRefGoogle Scholar
- 4.H.J. Kim, J.H. Jun, D.J. Choi, Ceram. Int. 34, 953 (2008)CrossRefGoogle Scholar
- 5.S.Y. Wang, W. Wang, Y.T. Qian, Thin Solid Films 372, 50 (2000)ADSCrossRefGoogle Scholar
- 6.J.C. Garcia, L.M.R. Scolfaro, A.T. Lino, V.N. Freire, G.A. Farias, C.C. Silva, H.W. Leite Alves, S.C.P. Rodrigues, E.F. da Silva, J. Appl. Phys. 100, 104103 (2006)ADSCrossRefGoogle Scholar
- 7.X. Zhao, D. Vanderbilt, Phys. Rev. B 65, 075105 (2002)ADSCrossRefGoogle Scholar
- 8.J.H. Choi, Y. Mao, J.P. Chang, Mater. Sci. Eng.: R: Reports 72 (2011) 97.CrossRefGoogle Scholar
- 9.K. Xiong, J. Robertson, Microelectron. Eng. 80, 408 (2005)CrossRefGoogle Scholar
- 10.C.A. Ponce, R.A. Casali, M.A. Caravaca, J. Phys. Condens. Matter 20, 45213 (2008)ADSCrossRefGoogle Scholar
- 11.M.A. Caravaca, R.A. Casali, J. Phys. Condens. Matter 17, 5795 (2005)ADSCrossRefGoogle Scholar
- 12.X.B. Lu, G.H. Shi, J.F. Webb, Z.G. Liu, Appl. Phys. A 77, 481 (2003)ADSCrossRefGoogle Scholar
- 13.R. Vali, Solid State Commun. 145, 497 (2008)ADSCrossRefGoogle Scholar
- 14.M. Sousa, C. Rossel, C. Marchiori, H. Siegwart, D. Caimi, J.-P. Locquet, D.J. Webb, R. Germann, J. Fompeyrine, K. Babich, J.W. Seo, Ch. Dieker, J. Appl. Phys. 102, 104103 (2007)ADSCrossRefGoogle Scholar
- 15.B.J. Kennedy, C.J. Howard, B.C. Chakoumakos, Phys. Rev. B 60, 2972 (1999)ADSCrossRefGoogle Scholar
- 16.R. Vali, Solid State Commun. 148, 29 (2008)ADSCrossRefGoogle Scholar
- 17.G. Lupina, G. Kozłowski, J. Dabrowski, Ch. Wenger, P. Dudek, P. Zaumseil, G. Lippert, Ch. Walczyk, H.-J. Müssig, Appl. Phys. Lett. 92, 062906 (2008)ADSCrossRefGoogle Scholar
- 18.R. Vali, Solid State Commun. 147, 1 (2008)ADSCrossRefGoogle Scholar
- 19.A. Deshpande, R. Inman, G. Jursich, C.G. Takoudis, J. Appl. Phys. 99, 094102 (2006)ADSCrossRefGoogle Scholar
- 20.K. Chang, F.-M. Chang, J. Ruzyllo, Solid State Electron. 50, 1670 (2006)ADSCrossRefGoogle Scholar
- 21.S. Sahhaf, R. Degraeve, V. Srividya, B. Kaczer, D. Gealy, N. Horiguchi, M. Togo, T.Y. Hoffmann, G. Groeseneken, IEEE Electron Dev. Lett. 31, 272 (2010)ADSCrossRefGoogle Scholar
- 22.X.H. Cheng, Z.R. Song, J. Jiang, Y.H. Yu, W.W. Yang, D.S. Shen, Appl. Surf. Sci. 252, 8073 (2006)ADSCrossRefGoogle Scholar
- 23.W. Nieveen, B.W. Schueler, G. Goodman, P. Schnabel, J. Moskito, I. Mowat, G. Chao, Appl. Surf. Sci. 231–232, 556 (2004)CrossRefGoogle Scholar
- 24.J.H. Nicola, H.N. Rutt, J. Phys. C: Solid State Phys. 7, 1381 (1974)ADSCrossRefGoogle Scholar
- 25.L.-P. Feng, Z.-T. Liu, Y.-M. Shen, Vacuum 83, 902 (2009)CrossRefGoogle Scholar
- 26.T. Erlbacher, M.P.M. Jank, M. Lemberger, A.J. Bauer, H. Ryssel, Thin Solid Films 516, 7727 (2008)ADSCrossRefGoogle Scholar
- 27.L.R.C. Fonseca, A.L. Xavier, Jr., M. Ribeiro, Jr., C. Driemeier, I.J.R. Baumvol, J. Appl. Phys. 102, 044108 (2007)ADSCrossRefGoogle Scholar
- 28.K. Xiong, Y. Du, K. Tse, J. Robertson, J. Appl. Phys. 101, 024101 (2007)ADSCrossRefGoogle Scholar
- 29.S. Monaghan, J.C. Greer, S.D. Elliott, J. Appl. Phys. 97, 114911 (2005)ADSCrossRefGoogle Scholar
- 30.W.-Q. Yang, W.-C. Zheng, H.-G. Liu, Physica B 405, 2697 (2010)ADSCrossRefGoogle Scholar
- 31.H.-N. Dong, S.-Y. Wu, C.-K. Duan, J. Alloys Compd. 408–412, 750 (2006)CrossRefGoogle Scholar
- 32.W.L. Scopel, A.J.R. da Silva, A. Fazzio, Phys. Rev. B 77, 172101 (2008)ADSCrossRefGoogle Scholar
- 33.G.-M. Rignanese, X. Gonze, G. Jun, K. Cho, A. Pasquarello, Phys. Rev. B 69, 184301 (2004)ADSCrossRefGoogle Scholar
- 34.Q.-Q. Sun, C. Zhang, L. Dong, Y. Shi, S.-J. Ding, D.W. Zhang, J. Appl. Phys. 103, 114102 (2008)ADSCrossRefGoogle Scholar
- 35.Z. Wu, R.E. Cohen, Phys. Rev. B 73, 235116 (2006)MathSciNetADSCrossRefGoogle Scholar
- 36.S.J. Clark, M.D. Segall, C.J. Pickard, P.J. Hasnip, M.J. Probert, K. Refson, M.C. Payne, Z. Kristallogr. 220, 567 (2005)CrossRefGoogle Scholar
- 37.D. Shin, Z.-K. Liu, Scripta Materialia 57, 201 (2007)CrossRefGoogle Scholar
- 38.J.A. Speer, B.J. Cooper, Am. Mineral. 67, 804 (1982)Google Scholar
- 39.J. Fuhrmann, J. Pickardt, Zeitschrift fuer Anorganische und Allgemeine Chemie 532, 171 (1986)CrossRefGoogle Scholar
- 40.H.S. Chen, Anisotropy of Elasticity about Metal, (Metallurgy Industry Press, Beijing, 1996)Google Scholar
- 41.S. Tian, Materials Physical Properties, (Beijing University of Aeronautics and Astronautics Press, Beijing, 2004)Google Scholar
- 42.L. Fast, J.M. Wills, B. Johansson, O. Eriksson, Phys. Rev. B 51, 17431 (1995)ADSCrossRefGoogle Scholar
- 43.S.L. Chaplot, R. Mittal, N. Choudhury, Thermodynamic Properties of Solids: Experiment and Modeling (Wiley-VCH, 2010)Google Scholar
- 44.M. Born, K. Huang, Dynamical Theory and Experiment I, (Springer-Verlag, Berlin, 1982)Google Scholar
- 45.O. Beckstein, J.E. Klepeis, G.L.W. Hart, O. Pankratov, Phys. Rev. B 63, 134112 (2001)ADSCrossRefGoogle Scholar
- 46.W. Voigt, Lehrbuch der kristallphysik, (Teubner, Leipzig, 1928)MATHGoogle Scholar
- 47.A. Reuss, Z. Angew, Math. Mech. 9, 49 (1929)MATHCrossRefGoogle Scholar
- 48.R. Hill, Proc. Phys. Soc. London 65, 349 (1952)ADSCrossRefGoogle Scholar
- 49.B. Mayer, H. Anton, E. Bott, M. Methfessel, J. Sticht, P.C. Schmidt, Intermetallics 11, 23 (2003)CrossRefGoogle Scholar
- 50.Q.P. Wang, N.G. Xie, X.L. Shi, J. University of Science and Technology Beijing 26, 345 (2004)Google Scholar
- 51.S.F. Pugh, Philos. Mag. 45, 833 (1954)Google Scholar
- 52.D.M. Bylander, L. Kleinman, Phys. Rev. B 41, 7868 (1990)ADSCrossRefGoogle Scholar
- 53.R.C. Fang, Solid Spectroscopy. (Chinese Science Technology University Press, Hefei, 2003)Google Scholar
- 54.C.M.I. Okoye, J. Phys.: Condens. Matter 15, 5945 (2003), and the references therein.ADSCrossRefGoogle Scholar
- 55.Y. Zheng, H. Mizuta, Y. Tsuchiya, M. Endo, D. Sato, S. Oda, J. Appl. Phys. 97, 023527 (2005)ADSCrossRefGoogle Scholar
- 56.A. Meldrum, S.J. Zinkle, L.A. Boatner, R.C. Ewing, Phys. Rev. B 59, 3981 (1999)ADSCrossRefGoogle Scholar