Reversible structural changes of in situ prepared As40Se60 nanolayers studied by XPS spectroscopy
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As40Se60 nanolayers, as-deposited, annealed and in situ illuminated by green (532 nm) laser light, were studied using synchrotron radiation photoelectron spectroscopy. Changes in composition and local atomic coordination occurring in the irradiated region of As40Se60 films were monitored by analysis of As 3d and Se 3d core levels. It was found that the thermal treatment causes a decrease of the concentration of homopolar (As–As and Se–Se) bonds. On the other hand, an increasing concentration of both As-rich and Se-rich structural units (s.u.) with homopolar As–As and Se–Se bonds was observed under in situ green laser illumination of As40Se60 nanolayers. This process appeared to be reversible for a few sequences of annealing and illuminating of the sample. After a few cycles storing at ambient conditions the As40Se60 film composition was gradually changing, i.e. the aging effect was detected due to a drastic loss of As under ambient conditions. The surface local structure of the As40Se60 nanolayers and their photoinduced transformation are discussed in detail.
KeywordsAs–Se nanolayers Photoinduced changes Synchrotron radiation photoelectron spectroscopy Core level Valence band Chalcogenide thin films
OK, RH and VM gratefully acknowledge support from the Hungarian Academy of Sciences within the Domus Hungarica Scientiarum et Artium. CERIC-ERIC consortium and Czech Ministry of Education (LM2015057) are acknowledged for financial support. The work was carried out within the framework of the DB-884 Project of the Ministry of Education and Science of Ukraine. The publication contains the results of research conducted with the grant support of the State Fund for Fundamental Research under the Competitive Project 0117U006384. Authors are also acknowledging the GINOP-2.3.2-15-2016-00041 project, which is co-financed by the European Union and the European Regional Development Fund.
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Conflict of interest
On behalf of all authors, the corresponding author states that there is no conflict of interest.
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