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MAPAN

, Volume 24, Issue 4, pp 207–214 | Cite as

Direct comparison between the NIST 10 V Compact Josephson Voltage Standard and the 2.5 V Programmable Josephson Voltage Standard

  • Shiv Kumar Jaiswal
  • Y. TangEmail author
Original Article

Abstract

The NIST 10 V Compact Josephson Voltage Standard (CJVS) and 2.5 V Programmable Josephson Voltage Standard (PJVS) were directly compared at 1.018 V and 2.511 V in February 2007. The difference between the two systems at 1.018 V (CJVS — PJVS) was −0.09 nV with an expanded uncertainty of 4.72 nV or a relative uncertainty of 4.64×10−9 at the 95 % confidence level where as the difference between the two systems at 2.511 V was 0.00 nV with an expanded uncertainty of 4.04 nV or a relative uncertainty of 1.61×10−9 at the 95 % confidence level. These intercomparison results demonstrated the satisfactory performance of the CJVS system handling minor trapped flux in the array and the effectiveness of the “NISTVolt software” to manage step jumps in the measurements.

Keywords

Relative Uncertainty Bias Current Voltage Step Device Under Test Bias Source 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Metrology Society of India 2009

Authors and Affiliations

  1. 1.National Physical Laboratory (NPLI)Council of Scientific and Industrial Research (CSIR)New DelhiIndia
  2. 2.National Institute of Standards and TechnologyGaithersburgUSA

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