Cadmium telluride thin-film response for a laser beam illumination
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The proposed optical system utilizes a 3 mm diameter Nd:YAG tunable laser which passes through the CdTe thin-film disk plate. Originating laser patterns are detected using CMOS camera, and the resolution of the laser pattern is analyzed with the help of well-defined quality criterion, the Full Width Half Maxima (FWHM). The differences between the responses of the system with and without the thin-film plate are compared. Finally, the optical output of the thin film for different visible wavelengths is found to be interesting to establish its field-controlling nature. The beam manipulation characteristics of the semiconducting element are determined, validating this element suitability for material processing.
KeywordsCdTe thin films Spot size FWHM Diffraction
The corresponding author is thankful to Prof. Nir Davidson and Prof. Asher A. Friesem (Department of Physics of Complex Systems, Weizmann Institute of Science, Israel) for fruitful discussions. This work was supported by the Israel Science Foundation (ISF), Russian Foundation for Basic Research (RFBR) (Grant Nos: 16-29-11698, 16-29-11744) and the Ministry of Science and Education, Russia, within the state assignment FSRC “Crystallography and Photonics” RAS.
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