Nano Research

, Volume 8, Issue 7, pp 2199–2205 | Cite as

Mode-synthesizing atomic force microscopy for 3D reconstruction of embedded low-density dielectric nanostructures

  • Pauline Vitry
  • Eric Bourillot
  • Cédric Plassard
  • Yvon Lacroute
  • Eric Calkins
  • Laurene Tetard
  • Eric Lesniewska
Research Article

Abstract

Challenges in nanoscale characterization call for non-invasive, yet sensitive subsurface characterization of low-density materials such as polymers. In this work, we present new evidence that mode-synthesizing atomic force microscopy can be used to detect minute changes in low-density materials, such as those engendered in electro-sensitive polymers during electron beam lithography, surpassing all common nanoscale mechanical techniques.

Moreover, we propose 3D reconstruction of the exposed polymer regions using successive high-resolution frames acquired at incremental depths inside the sample. In addition, the results clearly show the influence of increasing dwell time on the depth profile of the nano-sized exposed regions. Hence, the simple approach described here can be used for achieving sensitive nanoscale tomography of soft materials with promising applications in material sciences and biology.

Keywords

nanoscale subsurface imaging atomic force microscopy 3D reconstruction nanoscale tomography acoustic microscopy dielectric 

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Copyright information

© Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2015

Authors and Affiliations

  • Pauline Vitry
    • 1
  • Eric Bourillot
    • 1
  • Cédric Plassard
    • 1
  • Yvon Lacroute
    • 1
  • Eric Calkins
    • 2
    • 3
  • Laurene Tetard
    • 2
    • 3
  • Eric Lesniewska
    • 1
  1. 1.Physics DepartmentUniversity of BourgogneCedexFrance
  2. 2.Nanoscience Technology CenterUniversity of Central FloridaOrlandoUSA
  3. 3.Department of PhysicsUniversity of Central FloridaOrlandoUSA

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