Study of microhardness and electrical properties of proton irradiated polyethersulfone (PES)
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Polyethersulfone (PES) films were irradiated with 3 MeV proton beams in the fluence range 1013–1015 ions/cm2. The radiation induced changes in microhardness was investigated by a Vickers’ microhardness tester in the load range 100–1000 mN and electrical properties in the frequency range 100 Hz-1 MHz by an LCR meter. It is observed that microhardness of the film increases significantly as fluence increases up to 1014 ions/cm2. The bulk hardness of the films is obtained at a load of 400 mN. The increase in hardness may be attributed to the cross linking effect. There is an exponential increase in conductivity with log frequency and the effect of irradiation is significant at higher fluences. The dielectric constant/loss is observed to change significantly due to irradiation. It has been found that dielectric response in both pristine and irradiated samples obey the Universal law and is given by ɛ ∝ f n−1. These results were corroborated with structural changes observed in FTIR spectra of irradiated samples.
KeywordsPolyethersulfone microhardness conductivity dielectric response FTIR
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