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JOM

, Volume 69, Issue 12, pp 2803–2809 | Cite as

Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification

  • Qiwei Shi
  • Félix Latourte
  • François Hild
  • Stéphane Roux
Article

Abstract

The present study considers identification of crystal plasticity parameters from knowledge of a deformed microstructure, backtracked to the reference state, and known kinematics along the sample surface. This theoretical analysis is applied to a numerical (synthetic) test case. A two-dimensional (2D) microstructure with one dimension along the depth is generated, then deformed using a known crystal plasticity law. A procedure is proposed to calibrate the constitutive parameters, addressing the specific challenge of partial knowledge of boundary conditions. The proposed identification strategy combined with estimation of the reference microstructure is shown to retrieve the constitutive parameters with good accuracy.

Notes

Acknowledgements

The authors acknowledge financial support from Euratom research and training program 2014-2018 SOTERIA under grant agreement No. 661913. This paper reflects only the authors’ view; the Commission is not responsible for any use that may be made of the information it contains. The authors also thank Dr. Adrien Guery for constructive advice.

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Copyright information

© The Minerals, Metals & Materials Society 2017

Authors and Affiliations

  1. 1.LMT, ENS Paris-Saclay / CNRS / Université Paris-SaclayCachanFrance
  2. 2.EDF R&D, Site des RenardièresMoret-sur-LoingFrance

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