, Volume 62, Issue 12, pp 53–57 | Cite as

Atomic-scale STEM-EELS mapping across functional interfaces

  • Christian Colliex
  • Laura Bocher
  • Francisco de la Peňa
  • Alexandre Gloter
  • Katia March
  • Michael Walls
Research Summary Solid State Interfaces


Aberration-corrected scanning transmission electron microscopes can now raster Angström-sized electron probes across cross-sectional foils with interfaces parallel to the incident beam. Bright and annular dark field images deliver views of the structural arrangement of the atomic columns across such interfaces. In parallel, electron energy-loss spectroscopy is efficient for recording the electronic response of the specimen with a high level of spatial and energy resolution. It thus provides maps, atomic column by atomic column, of the nature, and in some cases of the bonding state, of the atoms across artificially grown heterolayers for electronics, spintronics, and photonics components.


Manganite Magnetic Tunnel Junction Atomic Column Aberration Corrector HAADF Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© TMS 2010

Authors and Affiliations

  • Christian Colliex
    • 1
  • Laura Bocher
    • 1
  • Francisco de la Peňa
    • 1
  • Alexandre Gloter
    • 1
  • Katia March
    • 1
  • Michael Walls
    • 1
  1. 1.Laboratoire de Physique des Solides (UMR CNRS 8502)Université Paris Sud XIOrsayFrance

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