High-density plasma-arc heating studies of FePt thin films
The effect of pulsed-thermal-processing with high-density plasma arc heating is discussed for 20 nm thick nanocrystalline FePt thin films. The dependence of the A1→L10 phase transformation on pulsed time and radiant energy of the pulse is quantified through x-ray diffraction and alternating gradient magnetometry. For 100 ms and 250 ms pulse widths, the phase transformation was observed. Higher radiant energy densities resulted in a larger measured coercivity associated with the L10 phase.
Unable to display preview. Download preview PDF.
- 1.Taken from the home page of Seagate, a leading hard drive manufacturer: www.seagate.com/newshinfo/technology/d4g.html.Google Scholar
- 11.R.D. Ott et al., “Pulse Thermal Processing (PTP) of Nanocrystalline Silicon Thin-Films,” JOM, 56 (10) (2004), pp. 45–47.Google Scholar
- 13.T. Thrum et al., The Development of a Powerful Vortex Stabilized Flash Lamp for RTP Applications, Proceedings from the IEEE International Conference on Plasma Science (2003), p. 451.Google Scholar
- 14.T. Thrum, A. Hewett, and D. Camm, “Experimental and Theoretical Determination of the Transient Radiation Characteristics of a High Power Water Vortex Stabilized Argon Arc Lamp,” IEEE International Conference on Plasma Science (2001), p. P2F03.Google Scholar
- 19.B.D. Cullity, S.R. Stock, and S. Stock, Elements of X-Ray Diffraction, 3rd Edition (Upper Saddle River, NJ: Prentice-Hall, 2001).Google Scholar
- 20.A. Cole et al., “Pulse Thermal Processing of FePt Thin Films,” manuscript under preparation (2006).Google Scholar