JOM

, Volume 53, Issue 7, pp 37–41 | Cite as

Analyzing localized corrosion in lon-implanted metals via XPS/AES

  • Charles F. WindischJr.
  • Donald R. Baer
  • Mark H. Engelhard
  • Russell H. Jones
Overview Localized Corrosion
  • 70 Downloads

Abstract

Acombined electrochemical/surface analysis approach coupled with the use of ion-implanted samples has been successfully used to study anodic processes relevant to intergranular stress corrosion cracking (IGSCC). Interpretation of the data and applying it to an understanding of IGSCC varies in complexity and difficulty with the system under study. In some cases, there is a direct correspondence between composition and corrosion rates while, in others, the chemistry is more complex and secondary processes become dominant under some conditions. Nevertheless, the use of this approach has proved valuable, at the very least providing a qualitative understanding of the interplay between oxidation of a metal and the chemistry of segregants at grain boundaries that has forwarded modeling efforts on IGSCC.

Keywords

Corrosion Product Stress Corrosion Crack Auger Electron Spectroscopy Localize Corrosion Pacific Northwest National Laboratory 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© TMS 2001

Authors and Affiliations

  • Charles F. WindischJr.
    • 1
  • Donald R. Baer
    • 1
  • Mark H. Engelhard
    • 1
  • Russell H. Jones
    • 1
  1. 1.Pacific Northwest National LaboratoryUSA

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