Microstructures and magnetic properties of [SiO2/FePt]5/Ag thin films

  • Fan Jiu-ping  (范九萍)
  • Xu Xiao-hong  (许小红)Email author
  • Jiang Feng-xian  (江凤仙)
  • Tian Bao-qiang  (田宝强)
  • Wu Hai-shun  (武海顺)


[SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 °C for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied to study the magnetic properties and microstructures of the films. The results show that without Ag underlayer [SiO2/FePt]5 films deposited onto the glass are FCC disordered; with the addition of Ag underlayer [SiO2/FePt]5/Ag films are changed into L10 and (111) mixed texture. The variation of the SiO2 nonmagnetic layer thickness in [SiO2/FePt]5/Ag films indicates that SiO2-doping plays an important role in improving the order parameter and the perpendicular magnetic anisotropy, and reducing the grain size and intergrain interactions. By controlling SiO2 thickness the highly perpendicular magnetic anisotropy can be obtained in the [SiO2 (0.6 nm)/FePt (3 nm)]5/Ag (50 nm) films and highly (001)-oriented films can be obtained in the [SiO2 (2 nm)/FePt (3 nm)]5/Ag (50 nm) films.

Key words

[SiO2/FePt]5 multilayer films SiO2-doping Ag underlayer (001) orientation 


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Copyright information

© Published by: Central South University Press, Sole distributor outside Mainland China: Springer 2008

Authors and Affiliations

  • Fan Jiu-ping  (范九萍)
    • 1
  • Xu Xiao-hong  (许小红)
    • 1
    Email author
  • Jiang Feng-xian  (江凤仙)
    • 1
  • Tian Bao-qiang  (田宝强)
    • 1
  • Wu Hai-shun  (武海顺)
    • 1
  1. 1.School of Chemistry and Materials ScienceShanxi Normal UniversityLinfenChina

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