Journal of Electronic Materials

, Volume 40, Issue 9, pp 1950–1955 | Cite as

Comparative Study of ENIG and ENEPIG as Surface Finishes for a Sn-Ag-Cu Solder Joint

  • Jeong-Won Yoon
  • Bo-In Noh
  • Seung-Boo Jung


Interfacial reactions and joint reliability of Sn-3.0Ag-0.5Cu solder with two different surface finishes, electroless nickel-immersion gold (ENIG) and electroless nickel-electroless palladium-immersion gold (ENEPIG), were evaluated during a reflow process. We first compared the interfacial reactions of the two solder joints and also successfully revealed a connection between the interfacial reaction behavior and mechanical reliability. The Sn-Ag-Cu/ENIG joint exhibited a higher intermetallic compound (IMC) growth rate and a higher consumption rate of the Ni(P) layer than the Sn-Ag-Cu/ENEPIG joint. The presence of the Pd layer in the ENEPIG suppressed the growth of the interfacial IMC layer and the consumption of the Ni(P) layer, resulting in the superior interfacial stability of the solder joint. The shear test results show that the ENIG joint fractured along the interface, exhibiting indications of brittle failure possibly due to the brittle IMC layer. In contrast, the failure of the ENEPIG joint only went through the bulk solder, supporting the idea that the interface is mechanically reliable. The results from this study confirm that the Sn-Ag-Cu/ENEPIG solder joint is mechanically robust and, thus, the combination is a viable option for a Pb-free package system.


Sn-Ag-Cu solder soldering intermetallic compounds (IMC) electronic packaging electroless nickel-immersion gold (ENIG) electroless nickel-electroless palladium-immersion gold (ENEPIG) 


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  1. 1.
    M. Abtew and G. Selvaduary, Mater. Sci. Eng. R 27, 95 (2000).CrossRefGoogle Scholar
  2. 2.
    C.M.L. Wu, D.Q. Yu, C.M.T. Law, and L. Wang, Mater. Sci. Eng. R 44, 1 (2004).CrossRefGoogle Scholar
  3. 3.
    G. Milad and D. Gudeczauskas, Met. Finish. 104, 33 (2006).CrossRefGoogle Scholar
  4. 4.
    G. Milad and M. Orduz, Met. Finish. 105, 25 (2007).CrossRefGoogle Scholar
  5. 5.
    Y.W. Yen, P.H. Tsai, Y.K. Fang, S.C. Lo, Y.P. Hsieh, and C. Lee, J. Alloys Compd. 503, 25 (2010).CrossRefGoogle Scholar
  6. 6.
    S.P. Peng, W.H. Wu, C.E. Ho, and Y.M. Huang, J. Alloys Compd. 493, 431 (2010).CrossRefGoogle Scholar
  7. 7.
    W.H. Wu, C.S. Lin, S.H. Huang, and C.E. Ho, J. Electron. Mater. 39, 2387 (2010).CrossRefGoogle Scholar
  8. 8.
    H.B. Kang, J.W. Lee, J.H. Bae, M.H. Park, J.W. Yoon, S.B. Jung, J.S. Ju, and C.W. Yang, J. Mater. Res. 23, 2195 (2008).CrossRefGoogle Scholar
  9. 9.
    H.S. Chun, J.W. Yoon, and S.B. Jung, J. Alloys Compd. 439, 91 (2007).CrossRefGoogle Scholar
  10. 10.
    J.W. Yoon and S.B. Jung, Z. Metallkd. 96, 1420 (2005).Google Scholar
  11. 11.
    J.W. Yoon, B.I. Noh, J.H. Yoon, H.B. Kang, and S.B. Jung, J. Alloys Compd. 509, L153 (2011).CrossRefGoogle Scholar
  12. 12.
    W.M. Chen, M. McCloskey, and S.C. O’Mathuna, Microelectron. Reliab. 46, 896 (2006).CrossRefGoogle Scholar
  13. 13.
    J.W. Yoon, J.H. Lim, W.C. Moon, H.J. Lee, J. Joo, and S.B. Jung, J. Mater. Res. 21, 3196 (2006).CrossRefGoogle Scholar

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© TMS 2011

Authors and Affiliations

  1. 1.School of Advanced Materials Science and EngineeringSungkyunkwan UniversitySuwonRepublic of Korea

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