Journal of Electronic Materials

, Volume 36, Issue 12, pp 1621–1624

Electron and Hole Capture Cross-Sections of Fe Acceptors in GaN:Fe Epitaxially Grown on Sapphire

  • T. Aggerstam
  • A. Pinos
  • S. Marcinkevičius
  • M. Linnarsson
  • S. Lourdudoss
Open Access
Article

Carrier trapping of Fe3+/Fe2+ deep acceptors in epitaxially grown GaN:Fe on sapphire was studied by time-resolved photoluminescence. For the investigated Fe doping levels on the order of 1018 cm−3, the luminescence decay times are strongly dependent on the Fe concentration, indicating that Fe centers act as predominant nonradiative recombination channels. Linear dependence of the decay time on the iron concentration allows estimation of the electron capture cross-section for the Fe3+ ions, which is equal to 1.9 × 10−15 cm2. The upper bound for the cross-section of the hole capture of Fe2+ was evaluated as 1 × 10−15 cm2.

Key words

GaN Fe semi-insulating high electron mobility transistor (HEMT) deep acceptor electron capture cross section  metal–organic vapor phase epitaxy (MOVPE) 

Copyright information

© TMS 2007

Authors and Affiliations

  • T. Aggerstam
    • 1
  • A. Pinos
    • 1
  • S. Marcinkevičius
    • 1
  • M. Linnarsson
    • 1
  • S. Lourdudoss
    • 1
  1. 1.Department of Microelectronics and Applied PhysicsRoyal Institute of TechnologyKistaSweden

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