Journal of Electronic Materials

, Volume 32, Issue 7, pp 756–760 | Cite as

Characterization of large single-crystal gamma-ray detectors of cadmium zinc telluride

  • A. Burger
  • M. Groza
  • Y. Cui
  • D. Hillman
  • E. Brewer
  • A. Bilikiss
  • G. W. Wright
  • L. Li
  • F. Lu
  • R. B. James
Special Issue Paper
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Accepted:

Abstract

The need for large, room-temperature gamma-ray spectrometers to be fabricated from a single crystalline section of a cadmium zinc telluride (CZT) boule was recently met by progress in crystal growth of high-resistivity material. The characterization of such large crystals provides us with an opportunity to better understand the detector physics and apply characterization techniques, which were difficult to implement and analyze on smaller crystals. In this study, metal-semiconductor-metal, planar-CZT detectors were fabricated from large (approximately 9 × 9 × 6 mm3), CZT single crystals. We have investigated the relationship between the results of the electric-field mapping via Pockels effect, photoconductivity data, and detector performance. Changes in the surface recombination and device characteristics showing departure from symmetry are caused and revealed by variations in the surface preparation.

Key words

CdZnTe room-temperature detector photoconductivity Pockels effect internal electric-field distribution 
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Copyright information

© TMS-The Minerals, Metals and Materials Society 2003

Authors and Affiliations

  • A. Burger
    • 1
  • M. Groza
    • 1
  • Y. Cui
    • 1
  • D. Hillman
    • 1
  • E. Brewer
    • 1
  • A. Bilikiss
    • 1
  • G. W. Wright
    • 1
  • L. Li
    • 2
  • F. Lu
    • 2
  • R. B. James
    • 3
  1. 1.Fisk UniversityNashville
  2. 2.Yinnel Tech Inc.South Bend
  3. 3.Brookhaven National LaboratoryUpton, L.I.

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