Metallurgical and Materials Transactions A

, Volume 46, Issue 3, pp 1405–1412 | Cite as

Mechanical Behavior of Nano-crystalline Metallic Thin Films and Multilayers Under Microcompression

Article

Abstract

Microcompression tests were performed to determine the mechanical behavior of nano-crystalline Cu/Fe and Fe/Cu multilayers, as well as monolithic Cu and Fe thin films. The results show that the micropillars of pure Cu thin film bulge out under large compressive strains without failure, while those of pure Fe thin film crack near the top at low compressive strains followed by shear failure. For Cu/Fe and Fe/Cu multilayers, the Cu layers accommodate the majority of plastic deformation, and the geometry constraints imposed by Fe layers exaggerates the bulging in the Cu layers. However, the existence of ductile Cu layers does not improve the overall ductility of Cu/Fe and Fe/Cu multilayers. Cracking in the Fe layers directly lead to the failure of the multilayer micropillars, although the Cu layers have very good ductility. The results imply that suppressing the cracking of brittle layers is more important than simply adding ductile layers for improving the overall ductility of metallic multilayers.

Keywords

High Yield Stress Brittle Layer Flat Punch Geometry Constraint Constituent Layer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

The authors would like to acknowledge the financial support from the Australian Research Council through the Laureate Fellowship for P.D. Hodgson.

References

  1. 1.
    E. Fortunato, P. Barquinha, and R. Martins: Adv. Mater., 2012, vol. 24, pp. 2945-86.CrossRefGoogle Scholar
  2. 2.
    A.G. Aberle: Thin Solid Films 2009, vol. 517, pp. 4706-10.CrossRefGoogle Scholar
  3. 3.
    M.A. Green: J. Mater. Sci. Mater. Electron., 2007, vol. 18, pp. 15-9.Google Scholar
  4. 4.
    B. Bhushan: in MEMS/NEMS and BioMEMS/BioNEMS: Materials, Devices, and Biomimetics Nanotribology and Nanomechanics II, B. Bhushan, ed., Springer, Berlin, 2011, pp. 833–945.Google Scholar
  5. 5.
    W.D. Nix: Metall. Trans. A, 1989, vol. 20, pp. 2217-45.CrossRefGoogle Scholar
  6. 6.
    S.M. Spearing: Acta Mater., 2000, vol. 48, pp. 179-96.CrossRefGoogle Scholar
  7. 7.
    W.N. Sharpe Jr: The MEMS handbook, 2002, vol. 3, pp. 1-33, CRC, Boca Raton.Google Scholar
  8. 8.
    J.Y. Zhang, X. Zhang, R.H. Wang, S.Y. Lei, P. Zhang, J.J. Niu, G. Liu, G.J. Zhang, and J. Sun: Acta Mater., 2011, vol. 59, pp. 7368-79.Google Scholar
  9. 9.
    J.Y. Zhang, S. Lei, Y. Liu, J.J. Niu, Y. Chen, G. Liu, X. Zhang, and J. Sun: Acta Mater., 2012, vol. 60, pp. 1610-22.Google Scholar
  10. 10.
    D. Gianola, and C. Eberl: JOM, 2009, vol. 61, pp. 24-35.CrossRefGoogle Scholar
  11. 11.
    K.J. Hemker, and W.N. Sharpe: Annu. Rev. Mater. Res., 2007, vol. 37, pp. 93-126.CrossRefGoogle Scholar
  12. 12.
    O. Kraft, P.A. Gruber, R. Mönig, and D. Weygand: Annu. Rev. Mater. Res., 2010, vol. 40, pp. 293-317.CrossRefGoogle Scholar
  13. 13.
    M.D. Uchic, P.A. Shade, and D.M. Dimiduk: Annu. Rev. Mater. Res., 2009, vol. 39, pp. 361-86.CrossRefGoogle Scholar
  14. 14.
    M. Uchic, D. Dimiduk, J. Florando, and W. Nix: Science, 2004, vol. 305, pp. 986-9.CrossRefGoogle Scholar
  15. 15.
    J.R. Greer, W.C. Oliver, and W.D. Nix: Acta Mater., 2005, vol. 53, pp. 1821-30.CrossRefGoogle Scholar
  16. 16.
    M.C. Liu, J.C. Huang, H.S. Chou, Y.H. Lai, C.J. Lee, and T.G. Nieh: Scr. Mater., 2009, vol. 61, pp. 840-3.CrossRefGoogle Scholar
  17. 17.
    M.C. Liu, X.H. Du, I.C. Lin, H.J. Pei, and J.C. Huang: Intermetallics, 2012, vol. 30, pp. 30-4.CrossRefGoogle Scholar
  18. 18.
    J.Y. Zhang, S. Lei, J. Niu, Y. Liu, G. Liu, X. Zhang, and J. Sun: Acta Mater., 2012, vol. 60, pp. 4054-64.Google Scholar
  19. 19.
    S.-W. Lee, S.M. Han, and W.D. Nix: Acta Mater., 2009, vol. 57, pp. 4404-15.CrossRefGoogle Scholar
  20. 20.
    J. Wang, C. Yang, and P.D. Hodgson: Scr. Mater., 2013, vol. 69, pp. 626-9.CrossRefGoogle Scholar
  21. 21.
    I.N. Sneddon: Int. J. Eng Sci 1965, vol. 3, pp. 47-57.CrossRefGoogle Scholar
  22. 22.
    M.A. Hopcroft, W.D. Nix, and T.W. Kenny: J. Microelectromech. Syst., 2010, vol. 19, pp. 229-38.CrossRefGoogle Scholar
  23. 23.
    A.R. Yavari, P.J. Desré, and T. Benameur: Phys. Rev. Lett., 1992, vol. 68, pp. 2235-8.CrossRefGoogle Scholar
  24. 24.
    E. Gaffet, M. Harmelin, and F. Faudot: J. Alloys Compd., 1993, vol. 194, pp. 23-30.CrossRefGoogle Scholar
  25. 25.
    G.T. GrayIii, T.C. Lowe, C.M. Cady, R.Z. Valiev, and I.V. Aleksandrov: Nanostruct. Mater., 1997, vol. 9, pp. 477–80.CrossRefGoogle Scholar
  26. 26.
    M.A. Meyers, A. Mishra, and D.J. Benson: Prog. Mater Sci., 2006, vol. 51, pp. 427-556.CrossRefGoogle Scholar
  27. 27.
    R. SuryanarayananIyer, C.A. Frey, S.M.L. Sastry, B.E. Waller, and W.E. Buhro: Mater. Sci. Eng. A, 1999, vol. 264, pp. 210–14.CrossRefGoogle Scholar
  28. 28.
    D. Jia, K.T. Ramesh, and E. Ma: Acta Mater., 2003, vol. 51, pp. 3495-509.CrossRefGoogle Scholar
  29. 29.
    K.Y. Xie, Y. Wang, S. Ni, X. Liao, J.M. Cairney, and S.P. Ringer: Scr. Mater., 2011, vol. 65, pp. 1037-40.CrossRefGoogle Scholar
  30. 30.
    F.F. Csikor, C. Motz, D. Weygand, M. Zaiser, and S. Zapperi: Science, 2007, vol. 318, pp. 251-4.CrossRefGoogle Scholar
  31. 31.
    Z.W. Shan, R.K. Mishra, S.A. Syed Asif, O.L. Warren, and A.M. Minor: Nat. Mater., 2008, vol. 7, pp. 115-9.CrossRefGoogle Scholar
  32. 32.
    M.C. Liu, C.J. Lee, Y.H. Lai, and J.C. Huang: Thin Solid Films 2010, vol. 518, pp. 7295-9.CrossRefGoogle Scholar
  33. 33.
    D.R.P. Singh, N. Chawla, G. Tang, and Y.L. Shen: Acta Mater., 2010, vol. 58, pp. 6628-36.CrossRefGoogle Scholar

Copyright information

© The Minerals, Metals & Materials Society and ASM International 2014

Authors and Affiliations

  • Jiangting Wang
    • 1
  • Chunhui Yang
    • 2
  • Peter D. Hodgson
    • 1
  1. 1.Institute for Frontier MaterialsDeakin UniversityGeelongAustralia
  2. 2.School of Computing, Engineering and MathematicsUniversity of Western SydneyPenrithAustralia

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