, Volume 14, Issue 6, pp 477–482

Characterisation of Ba2In2 − xSnxO5 + x/2 oxide ion conductors

  • Aurélie Rolle
  • Helen Seymour
  • Pascal Roussel
  • Annick Rubbens
  • Rose-Noëlle Vannier
Original Paper


The Ba2In2 − xSnxO5 + x/2 solid solution was confirmed up to x = 1 by solid-state reaction. X-ray diffraction at room and at elevated temperatures, Raman scattering and impedance spectroscopy were used to characterise the samples. The structure refinement of the composition x = 0.1 from neutron diffraction data reveals that tin is preferentially located in the tetrahedral layers of the brownmillerite.


Oxide ion conductors Ba2In2 − xSnxO5 + x/2 X-ray diffraction Neutron diffraction Raman scattering 


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Copyright information

© Springer-Verlag 2008

Authors and Affiliations

  • Aurélie Rolle
    • 1
  • Helen Seymour
    • 1
  • Pascal Roussel
    • 1
  • Annick Rubbens
    • 1
  • Rose-Noëlle Vannier
    • 1
  1. 1.UCCS—Unité de Catalyse et Chimie du Solide, Equipe de Chimie du Solide, CNRS UMR 8181ENSCL/UST Lille 1Villeneuve d’Ascq CedexFrance

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