Plasmonics

, Volume 12, Issue 4, pp 1007–1013 | Cite as

Electromagnetically Induced Transparency and Refractive Index Sensing for a Plasmonic Waveguide with a Stub Coupled Ring Resonator

  • Z. D. Zhang
  • R. B. Wang
  • Z. Y Zhang
  • J. Tang
  • W. D. Zhang
  • C. Y. Xue
  • S. B. Yan
Article
First Online:
Received:
Accepted:

Abstract

A plasmonic refractive index sensor based on electromagnetically induced transparency (EIT) composed of a metal-insulator-metal (MIM) waveguide with stub resonators and a ring resonator is presented. The transmission properties and the refractive index sensitivity are numerically studied with the finite element method (FEM). The results revealed an EIT-like transmission spectrum with an asymmetric line profile and a refractive index sensitivity of 1057 nm/RIU are obtained. The coupled mode theory (CMT) based on transmission line theory is adopted to illustrate the EIT-like phenomenon. Multiple EIT-like peaks are observed in the transmission spectrum of the derived structures based on the MIM waveguide with stub resonator coupled ring resonator. To analyze the multiple EIT-like modes of the derived structures, the H z field distribution is calculated. In addition, the effect of the structural parameters on the EIT-like effect is also studied. These results provide a new method for the dynamic control of light in the nanoscale.

Keywords

Surface plasmon polaritons Metal-insulator-metal waveguide Refractive index sensor Finite element method 
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Notes

Acknowledgments

This work was supported by the National Natural Science Foundation of China (Grant Nos. 61275166 and 61575117), the National Science Fund for Distinguished Young Scholars (Grant No. 51225504 and 61525107 ), the Natural Science Research Foundation of North University of China (Grant No 110246), Open Foundation of Science and Technology on Electronic Test and Measurement Laboratory of North University of China (Grant No. ZDSYSJ2015003), Program for the Top Young and Middle-aged Innovative Talents of Higher Learning Institutions of Shanxi, and the North University of China Science Fund for Distinguished Young Scholars.

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Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  • Z. D. Zhang
    • 1
    • 2
  • R. B. Wang
    • 1
    • 2
    • 3
  • Z. Y Zhang
    • 4
  • J. Tang
    • 1
    • 2
  • W. D. Zhang
    • 1
    • 2
  • C. Y. Xue
    • 1
    • 2
  • S. B. Yan
    • 1
    • 2
  1. 1.Science and Technology on Electronic Test & Measurement LaboratoryNorth University of ChinaTaiyuanChina
  2. 2.Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of EductionNorth University of ChinaTaiyuanChina
  3. 3.School of Mechatronics engineering North University of ChinaTaiyuanChina
  4. 4.School of Physics and Information TechnologyShaanxi Normal UniversityXi’anChina

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