Plasmonics

, Volume 8, Issue 2, pp 715–722

Sensing Nanometer Depth of Focused Optical Fields with Scanning Surface Plasmon Microscopy

  • Lotfi Berguiga
  • Elise Boyer-Provera
  • Juan Elezgaray
  • Françoise Argoul
Article

DOI: 10.1007/s11468-012-9462-1

Cite this article as:
Berguiga, L., Boyer-Provera, E., Elezgaray, J. et al. Plasmonics (2013) 8: 715. doi:10.1007/s11468-012-9462-1

Abstract

Evanescent wave imaging has been developed in the past decades for discriminating sub-micronic structures confined on a planar surface from bulk medium. However, this imaging method assumes a correct orientation of the objective lens versus the normal of the sample plane (null tilt angle) for a uniform evanescent illumination of the sample. Here, we propose to use the \(V(Z)\) response of a heterodyne scanning microscope coupled to a high numerical aperture lens to compensate the tilt, scanning images in three dimensions. This method can be used in standard glass to dielectric reflection regime or coupled to surface plasmon resonance. We show that in the second case, we can afford tilt angle corrections better than 10\(^{-4}\) radian. As an illustration, this method is applied to a patterned surface with nanometer-squared silica islets and to adsorbed nanoparticles.

Keywords

Surface plasmon microscopy Evanescent waves Heterodyne interferometry Scanning microscopy Inverse problem 

Copyright information

© Springer Science+Business Media New York 2012

Authors and Affiliations

  • Lotfi Berguiga
    • 1
  • Elise Boyer-Provera
    • 1
  • Juan Elezgaray
    • 2
  • Françoise Argoul
    • 1
  1. 1.CNRS, USR3010Université de LyonLyonFrance
  2. 2.CNRS, UMR 5248Université Bordeaux 1–ENITABPessacFrance

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