An elliptical nano-pinhole structure-based plasmonic lens was designed and investigated experimentally by means of focused ion beam nanofabrication, atomic force microscope imaging, and scanning near-field optical microscope (NSOM). Two scan modes, tip scan and sample scan, were employed, respectively, in our NSOM measurements. Both the scan modes have their characteristics while probing the plasmonic lenses. Our experimental results demonstrated that the lens can realize subwavelength focusing with elongated depth of focus. This type of lens can be used in micro-systems such as micro-opto-electrical–mechanical systems for biosensing, subwavelength imaging, and data storage.
Plasmonic lenses FIB Elliptical nano-pinhole NSOM
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The work was supported by the National Natural Science Foundation of China (No.60877021 and No.61077010).
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