Terahertz Surface Plasmon-Polariton Superfocusing in Coaxial Cone Semiconductor Structures
It is shown that in coaxial cone semiconductor structures, the strong localization of surface plasmon polariton (SPP) is possible in terahertz wave regions. During the propagation through this structure, the SPP acquires the following peculiarities: its wavelength essentially decreases and the diffraction processes do not hinder its localization in very small regions; the wave fields noticeably increase. The dissipative processes are also essential, and, having a noticeable role in terahertz regions, do not hinder the strong localization of the SPP. On the basis of such structure, it is possible to create a scanning THz microscope with the resolution equal to a few microns.
KeywordsTHz wave Surface plasmon polariton THz scanning microscope Superfocusing Negative permittivity
- 1.Mittleman DM (ed) (2002) Sensing with Terahertz radiation. Springer, HeidelbergGoogle Scholar
- 10.Hu BB, Nuss MC (1995) Opt Lett 20:1716–1718Google Scholar
- 16.Pohl DW (1991) Advances in optical and electron microscopy. Academic, New YorkGoogle Scholar
- 22.Agranovich VM, Mills DL (eds) (1982) Surface polaritons. North-Holland, AmsterdamGoogle Scholar