Science China Physics, Mechanics and Astronomy

, Volume 57, Issue 4, pp 637–643

Controlling the surface buckling wrinkles by patterning the material system of hard-nano-film/soft-matter-substrate

  • Dan Wu
  • YaJun Yin
  • HuiMin Xie
  • YuanFang Shang
  • ChuanWei Li
  • LiFu Wu
  • XiangLu Dai
Article

Abstract

Wrinkling and buckling of nano-films on the compliant substrate are always induced due to thermal deformation mismatch. This paper proposes effective means to control the surface wrinkling of thin film on the compliant substrate, which exploits the curvatures of the curve cracks designed on the stiff film. The procedures of the method are summarized as: 1) curve patterns are fabricated on the surface of PDMS (Polydimethylsiloxane) substrate and then the aluminum film with the thickness of several hundred nano-meters is deposited on the substrate; 2) the curve patterns are transferred onto the aluminum film and lead to cracking of the film along the curves. The cracking redistributes the stress in the compressed film on the substrate; 3) on the concave side of the curve, the wrinkling of the film surface is suppressed to be identified as shielding effect and on the convex side the wrinkling of the film surface is induced to be identified as inductive effect. The shielding and inductive effects make the dis-ordered wrinkling and buckling controllable. This phenomenon provides a potential application in the fabrication of flexible electronic devices.

Keywords

mismatch of thermal deformation wrinkling and buckling inductive effect shielding effect 

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Copyright information

© Science China Press and Springer-Verlag Berlin Heidelberg 2014

Authors and Affiliations

  • Dan Wu
    • 1
  • YaJun Yin
    • 1
  • HuiMin Xie
    • 1
  • YuanFang Shang
    • 2
  • ChuanWei Li
    • 1
  • LiFu Wu
    • 1
  • XiangLu Dai
    • 1
  1. 1.Key Laboratory of Applied Mechanics (AML), Department of Engineering MechanicsTsinghua UniversityBeijingChina
  2. 2.The State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision InstrumentsTsinghua UniversityBeijingChina

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