Experimental Mechanics

, Volume 46, Issue 1, pp 39–46

Surface Residual Stress Measurement Using Curvature Interferometry

Original Article

Abstract

Surface roughness plays an important role in the delamination wear caused by rough surface contact. A recent dislocation model analysis predicts that nano-scale contacts of surface steps induce nucleation of dislocations leading to pro-load and anti-load dislocation segregation near the contact surface. Such dislocation segregation generates a sub-layer of tensile residual stress in a much thicker layer of compressive residual stress near the surface. The tensile sub-layer thickness is expected to be about 50 to 100 times the step height. In order to verify the predictions of the model analysis, contact experiments are carried out on polycrystalline aluminum surface to determine the existence of the tensile sub-layer. The variation of the residual stress along the thickness direction is measured using a newly developed high sensitivity curvature-measurement interferometer. The residual stress distribution measured with sub-nanometer spatial resolution indicates that contact loading leads to formation of a highly stressed sub-layer of tensile residual stress within a much thicker layer of compressive residual stress. Implications of tensile residual stress for delamination wear are discussed.

Keywords

Residual stress Contact loading Rough surface Curvature interferometer 

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References

  1. 1.
    Lim SC, Ashby MF (1986) Wear mechanisms map. Cambridge University Press, Cambridge, UK.Google Scholar
  2. 2.
    Greenwood JA, Williamson JBP (1966) Contact of nominally flat surfaces. Proc R Soc Lond, A295:300–319.Google Scholar
  3. 3.
    Majumdar A, Bhushan B (1991) Fractal model of elastic-plastic contact between rough surface. ASME J Trib 113:1–11.Google Scholar
  4. 4.
    Majumdar A, Bhushan B (1995) Characterization and modeling of surface roughness and contact mechanics. In: Bushan B (ed) Handbook of nano- micro-tribology. CRC Press, Boca Raton, FL, USA.Google Scholar
  5. 5.
    Whitehouse DJ (1998) Surfaces: an essential link in nanotechnology. Nanotechnology 9:113–117.CrossRefGoogle Scholar
  6. 6.
    Yu HH, Shrotriya P, Wang J, Kim K-S (2003) Dislocation nucleation and segregation in nano-scale contact of stepped surfaces. In: Proceedings of MRS Fall Meetings, p 795.Google Scholar
  7. 7.
    Rice JR, Thomson R (1973) Ductile versus brittle behavior of crystals. Philos Mag 29:73–97.Google Scholar
  8. 8.
    Flinn PA, Gardner DS, Nix WD (1987) Measurement and interpretation of stress in aluminum-based metallization as a function of thermal history. IEEE Trans Electron Devices ED-34:689–699.Google Scholar
  9. 9.
    Taylor C, Barlett D, Chason E, Floro J (March 1998) Multibeam optical sensor (MOS): a laser based thin film growth monitor. The Industrial Physics 26–30.Google Scholar
  10. 10.
    Rosakis AJ, Singh RP, Tsuji Y, Kolawa E, Moore NR (1998) Full field measurements of curvature using coherent gradient sensing: application to thin film characterization. Thin Solid Films 325(1–2):42–54.Google Scholar
  11. 11.
    Stoney GG (1909) The tension of metallic films deposited by electrolysis. Proc R Soc Lond A82:172–175.Google Scholar
  12. 12.
    Hutchinson JW, Suo Z (1992) Mixed mode cracking in layered materials. Adv Appl Mech 29:61–193.Google Scholar

Copyright information

© Society for Experimental Mechanics 2006

Authors and Affiliations

  1. 1.Department of Mechanical EngineeringUniversity of CaliforniaRiversideUSA
  2. 2.Department of Mechanical EngineeringIowa State UniversityAmesUSA
  3. 3.Division of EngineeringBrown UniversityProvidenceUSA

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