Nanoscale fretting wear study by scanning probe microscopy
- Cite this article as:
- Varenberg, M., Etsion, I. & Halperin, G. Tribol Lett (2005) 18: 493. doi:10.1007/s11249-005-3609-6
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Nanoscale fretting wear was studied by using scanning probe microscopy (SPM) and a newly proposed unified approach of slip index. The production of SiO2 colloidal probes and the SPM calibration are described. Partial and gross slip fretting with displacement amplitudes from 5 to 500 nm were used for the study. Friction coefficient and nanowear results are presented showing a substantial increase of the friction at the transition from partial to gross slip and a significant difference between damaged surfaces in the two fretting regimes.