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Fault model-driven testing from FSM with symbolic inputs

  • Omer Nguena TimoEmail author
  • Alexandre Petrenko
  • S. Ramesh
Article
  • 13 Downloads

Abstract

Test generation based on one-by-one analysis of potential implementations in fault models is challenging; it is indeed impossible or inefficient to enumerate each and every implementation, even when a fault model defines a finite but a significant number of implementations. We propose an approach for fault model and constraint solving-based testing from a particular type of extended finite state machines called a symbolic input finite state machine (SIFSM). Transitions in SIFSMs are labeled with symbolic inputs, which are predicates on input variables having possibly infinite domains. Its implementations, mutants, are also represented by SIFSMs. The generated tests are complete in a given fault domain which is a set of mutants specified with a so-called mutation machine. We define a well-formed mutation SIFSM for describing various types of faults. Given a mutation SIFSM, we develop methods for evaluating the adequacy of a test suite and generating complete tests. Experimental results with the prototype tool we have developed indicate that the approach is applicable to industrial-like systems.

Keywords

Extended FSM Conformance testing Mutation testing Fault model-based test generation Constraint solving 

Notes

Funding information

This work is supported in part by GM, NSERC of Canada and MESI (Ministère de l’Économie, Science et Innovation) of Gouvernement du Québec.

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Copyright information

© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  1. 1.Computer Research Institute of Montreal - CRIMMontrealCanada
  2. 2.GM Global R&DWarrenUSA

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