Scientometrics

, Volume 66, Issue 3, pp 481–492 | Cite as

Issues in measuring the degree of technological specialisation with patent data

  • Nicolas van Zeebroeck
  • Bruno van Pottelsberghe de la Potterie
  • Wook Han
Article

Summary

This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system.

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Copyright information

© Springer-Verlag/Akadémiai Kiadó 2006

Authors and Affiliations

  • Nicolas van Zeebroeck
    • 1
  • Bruno van Pottelsberghe de la Potterie
    • 2
  • Wook Han
    • 3
  1. 1.ULB - Solvay Business School, Centre Emile Bernheim (CEB)
  2. 2.Brussels University (ULB), Solvay Business School, CEB, DULBEA and CEPR
  3. 3.ULB - Solvay Business School

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