Response Mechanism of the Base-in-Well Bipolar Magnetotransistor
Micro- and Nanoelectronic Devices
Received:
- 14 Downloads
- 1 Citations
Abstract
For the base-in-well bipolar magnetotransistor, a computer simulation is conducted in conjunction with an experiment. The following points are made: (i) Bulk recombination is important in the response of the device to an applied magnetic field. (ii) The device shows threshold behavior. (iii) The relative magnetic-field sensitivity of collector current is dependent on the applied magnetic flux density; moreover, the former grows in magnitude with decreasing flux density if this is sufficiently low. (iv) The relative sensitivity changes sign as the base bias is varied. A maximum relative sensitivity of about 2000 T−1 is achieved in measurements of the earth’s magnetic field.
Keywords
Magnetic Field Recombination Computer Simulation Flux Density Magnetic Flux
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
Preview
Unable to display preview. Download preview PDF.
REFERENCES
- 1.Baranochnikov, M.L., Mikromagnitoelektronika (Micromagnetoelectronics), Moscow: DMK Press, 2001.Google Scholar
- 2.Roumenin, C.S., Bipolar Magnetotransistor Sensors: An Invited Review, Sens. Actuators, A, 1990, vol. 24, no.2, p. 83.Google Scholar
- 3.Kozlov, A.V., Korolev, M.A., Smirnov, S.Yu., Chaplygin, Yu.A., and Tikhonov, R.D., Triple-Collector Lateral Bipolar Magnetotransistor: Response Mechanism and Relative Sensitivity, Mikroelektronika, 2003, vol. 32, no.3, pp. 219–225.Google Scholar
- 4.Kozlov, A.V., Reveleva, M.A., and Tikhonov, R.D., Dual-Collector Lateral Bipolar Magnetotransistor: Carrier Transport and Relative Sensitivity, Mikroelektronika, 2003, vol. 32, no.6, pp. 474–480.Google Scholar
- 5.Tikhonov, R.D., The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors, Mikroelektronika, 2004, vol. 33, no.6, pp. 465–468.Google Scholar
- 6.Amelichev, V.V., Galushkov, A.I., Mirgorodskii, Yu.N., Tikhomirov, P.A., Chaplygin, Yu.A., Shorin, M.V., and Shubin, S.V., Dual-Collector Lateral Bipolar Magnetotransistor: Simulation and the Identification of Temperature-Compensation Conditions, Datchiki Sist., 1999, no. 6, pp. 38–42.Google Scholar
- 7.Korolev, M.A., Chaplygin, Yu.A., Amelichev, V.V., Tikhonov, R.D., and Shorin, M.V., Improving the Sensitivity of Lateral Bipolar Magnetotransistors, Izv. Vyssh. Uchebn. Zaved., Elektron., 2002, no. 1, pp. 40–43.Google Scholar
- 8.Kozlov, A.V., Reveleva, M.A., and Tikhonov, R.D., Mechanism Underlying the Negative Relative Sensitivity of Collector Current in Lateral Bipolar Magnetotransistors, Izv. Vyssh. Uchebn. Zaved., Elektron., 2003, no. 5, pp. 57–62.Google Scholar
- 9.Tikhonov, R.D., Korolev, M.A., Smirnov, S.Yu., and Chaplygin, Yu.A., Structural Optimization of the Planar Bipolar Magnetotransistor, Oboronnyi Kompleks Nauch. Tekh. Prog. Rossii, 2003, no. 2, pp. 66–70.Google Scholar
- 10.Tikhonov, R.D. and Kozlov, A.V., Sensitivity-Structure Relationship of a Bipolar Magnetotransistor Formed in a Diffused Well, Oboronnyi Kompleks Nauch. Tekh. Prog. Rossii, 2003, no. 4, pp. 56–60.Google Scholar
- 11.Tikhonov, R.D. and Kozlov, A.V., Sensitivity of the Triple-Collector Bipolar Magnetotransistor, Oboronnyi Kompleks Nauch. Tekh. Prog. Rossii, 2004, no. 4, pp. 57–62.Google Scholar
- 12.Kozlov, A.V., Reveleva, M.A., and Tikhonov, R.D., Relative Sensitivity of the Dual-Collector Bipolar Magnetotransistor as a Function of Carrier Distribution, Mikrosist. Tekh., 2003, no. 10, pp. 17–22.Google Scholar
- 13.Kozlov, A.V. and Tikhonov, R.D., Negative Sensitivity of Collector Current in Bipolar Magnetotransistors, Mikrosist. Tekh., 2004, no. 10, p. 17.Google Scholar
- 14.Kozlov, A.V., Reveleva, M.A., and Tikhonov, R.D., Bulk Recombination in Bipolar Magnetotransistors, Datchiki Sist., 2003, no. 11, pp. 24–27.Google Scholar
- 15.Kozlov, A.V. and Tikhonov, R.D., Bulk-Recombination Mechanism of Sensitivity in Magnetotransistors, Datchiki Sist., 2004, no. 8, p. 40.Google Scholar
- 16.Kozlov, A.V. and Tikhonov, R.D., Bipolar-Magnetotransistor Sensitivity, Metrologiya, 2004, no. 6, pp. 29–35.Google Scholar
- 17.Kozlov, A.V., Reveleva, M.A., and Tikhonov, R.D., RF Patent 2 239 916.Google Scholar
- 18.Kozlov, A., Reveleva, M., and Tikhonov, R., The Optimisation of Relative Current Sensitivity of Bipolar Magnetotransistor, in Proc. SPIE—Int. Soc. Opt. Eng., 2003, vol. 5401, pp. 362–368.Google Scholar
- 19.Kozlov, A.V. and Tikhonov, R.D., Base-in-Well Bipolar Magnetotransistor, Izmer. Tekh., 2004, no. 9, pp. 34–39.Google Scholar
- 20.Tikhonov, R.D., A Study of the Base-in-Well Bipolar Magnetotransistor, Datchiki Sist., 2004, no. 9, pp. 24–27.Google Scholar
- 21.Baltes, H.P. and Popovic, R.S., Integrated Semiconductor Magnetic Field Sensors, Proc. IEEE, 1986, vol. 74, no.8, pp. 1107–1132.Google Scholar
- 22.Popovic, R.S. and Baltes, H.P., Dual-Collector Magnetotransistor Optimized with Respect to Injection Modulation, Sens. Actuators, 1983, vol. 4, pp. 155–163.Google Scholar
- 23.Riccobene, C., Wachutka, G., Burgler, J., and Baltes, H., Operation Principle of Dual Collector Magnetotransistors Studied by Two-Dimensional Simulation, IEEE Trans. Electron Devices, 1994, vol. 41, p. 1136.Google Scholar
- 24.Vikulin, I.M. and Stafeev, V.I., Fizika poluprovodnikovykh priborov (Physics of Semiconductor Devices), Moscow: Radio i Svyaz’, 1990.Google Scholar
- 25.Glauberman, M.A., Kozel, V.V., and Nakhabin, A.V., Carrier Transport in the Dual-Collector Magnetotransistor, Fiz. Tekh. Poluprovodn. (St. Petersburg), 2000, vol. 34, issue5, p. 662.Google Scholar
- 26.Galushkov, A.I. and Chaplygin, Yu.A., Integrated Magnetic-Field Microsensors, Izv. Vyssh. Uchebn. Zaved., Elektron., 2000, nos. 4–5, pp. 124–127.Google Scholar
- 27.Kasimov, F.D., Integrated Magnetoelectronic and Magnetonegatronic Elements and Circuits, Peterb. Zh. Elektron., 2003, no. 3, p. 65.Google Scholar
- 28.Podlepetskii, B.I., Integrated Semiconductor Sensors: Status and Design Prospects, Chip News, 1998, no. 5, pp. 38–45.Google Scholar
- 29.Vikulin, I.M., Vikulina, L.F., and Stafeev, V.I., Magnetotransistors: An Overview, Fiz. Tekh. Poluprovodn. (St. Petersburg), 2000, vol. 34, issue1, pp. 3–10.Google Scholar
- 30.Fabian, G., Magnetic Bipolar Transistor, Appl. Phys. Lett., 2004, vol. 84, no.1, pp. 85–88.Google Scholar
- 31.Avram, J., Bipolar Magnetic Microsensor for Longitudinal Fields, Sens. Actuators, Appl. Phys., 2004, vol. 102, no.2.Google Scholar
- 32.Glauberman, M.A., Yegorov, V.V., Kozel, V.V., and Kanishcheva, N.A., Magnetic-Field Sensitivity of Transistor Structures with Diffusion Transport of Injected Carriers, Fiz. Tekh. Poluprovodn. (St. Petersburg), 2003, vol. 37, issue1, pp. 32–37.Google Scholar
- 33.Baranochnicov, M.L., Krasnikov, G.J., Mordcovich, V.N., et al., US Patent 5 542 080, 1998.Google Scholar
- 34.Rashba, E.I. and Tolpygo, K.B., Forward Current-Voltage Characteristic of a Planar Rectifier at High Currents, Zh. Tekh. Fiz., 1956, vol. 26, no.7, pp. 1419–1427.Google Scholar
- 35.Stafeev, V.I., Current-Voltage Characteristic of a Diode as Dependent on the Bulk Resistance of the Semiconductor, Zh. Tekh. Fiz., 1958, vol. 28, no.8, pp. 1631–1641.Google Scholar
- 36.Stafeev, V.I., Diffusion-Displacement Modulation as a New Concept of Semiconductor Devices, Fiz. Tverd. Tela (Leningrad), 1959, vol. 1, issue6, p. 841.Google Scholar
- 37.Lampert, M.A. and Rose, A., Volume-Controlled Two-Carrier Currents in Solids: the Injected Plasma Case, Phys. Rev., 1961, vol. 121, no.1, pp. 26–37.Google Scholar
- 38.Gribnikov, Z.S., Theory of Carrier Injection in Long Diodes, Fiz. Tverd. Tela (Leningrad), 1965, vol. 7, issue1, pp. 251–257.Google Scholar
- 39.Baron, R. and Mayer, J.W., Double Injection in Semiconductors, in Semiconductors and Semimetals, New York: Academic, 1970, vol. 6, pp. 201–313.Google Scholar
- 40.Adirovich, E.I., Karageorgii-Alkaev, P.M., and Leiderman, A.Yu., Toki dvoinoi inzhektsii v poluprovodnikakh (Double-Injection Currents in Semiconductors), Moscow: Sovetskoe Radio, 1978.Google Scholar
- 41.Fedotov, Ya.A., Osnovy fiziki poluprovodnikovykh priborov (Fundamentals of Semiconductor-Device Physics), Moscow: Sovetskoe Radio, 1963.Google Scholar
- 42.Stafeev, V.I. and Karakushan, E.I., Magnitodiody (Magnetic Diodes), Moscow: Nauka, 1975.Google Scholar
- 43.Egiazaryan, G.A., Mnakatsanyan, G.A., Murygin, V.I., and Stafeev, V.I., Silicon Magnetic Diodes Sensitive to the Magnetic-Field Direction, Fiz. Tekh. Poluprovodn. (Leningrad), 1975, vol. 9, issue7, pp. 1252–1259.Google Scholar
- 44.Levitas, I.S., Pozhela, Yu.K., and Sashchuk, A.P., Galvanomagnetic-Recombination Dynamics, Fiz. Tekh. Polu-provodn. (Leningrad), 1972, vol. 6, issue1, p. 205.Google Scholar
- 45.Levitas, I.S., Pozhela, Yu.K., Staleraitis, K.K., and Yanavichene, N.Yu., Magnetogradient Effect, Fiz. Tekh. Poluprovodn. (Leningrad), 1975, vol. 9, pp. 1191–1192.Google Scholar
- 46.Malytenko, V.K., Bolgov, S.S., and Malozovsky, Yu.M., Magnetoconcentration Effect at Nonlinear Recombination of Current Carriers, Phys. Status Solidi A, 1978, vol. 50, pp. 723–732.Google Scholar
- 47.Vladimirov, V.V., Volkov, A.F., and Meilikhov, E.Z., Plazma poluprovodnikov (Semiconductor Plasmas), Moscow: Atomizdat, 1979.Google Scholar
- 48.Pozhela, Yu.K. and Staleraitis, K.K., Drift of the Electron-Hole Plasma in Finite-Length Specimens Immersed in a Magnetic Field, Fiz. Tekh. Poluprovodn. (Leningrad), 1980, vol. 14, issue6, pp. 1240–1242.Google Scholar
- 49.Cristoloveanu, S., Magnetic Field and Surface Influences on Double Injection Phenomena in Semiconductors, Parts 1, 2, Phys. Status Solidi A, 1981, vol. 64, no.2, pp. 683–695; vol. 65, no. 1, pp. 281–292.Google Scholar
- 50.Gorbatyi, I.N., Secondary-Injection Breakdown of the Microwave p-i-n Diode, Doctoral Dissertation, Moscow: Moscow Institute of Electronic Engineering (Technical University), 2003.Google Scholar
- 51.Avagyan, A.Kh., Gorbatyi, I.N., and Murygin, V.I., Modulation Magnetotransistor, Elektron. Tekh., Ser. 10, 1983, no. 4(40), pp. 49–52.Google Scholar
- 52.Gorbatyi, I.N. and Zubenko, F.G., Collector Characteristics of a Magnetotransistor, Elektron. Tekh., Ser. 2, 1986, no. 3(182), pp. 48–52.Google Scholar
- 53.Vikulin, I.M., Glauberman, M.A., and Yegorov, V.V., Injection-Inversion Magnetosensitive Structure, Sens. Actuators, A, 1991, vol. 28, no.3, pp. 185–190.Google Scholar
- 54.Usanov, D.A. and Skripal’, A.V., Fizika raboty poluprovodnikovykh priborov v skhemakh SVCh (Physics of Semiconductor Devices Operating in Microwave Circuits), Saratov: Saratov Gos. Univ., 1999.Google Scholar
- 55.Kuchis, E.V., Gal’vanomagnitnye effekty i metody ikh issledovaniya (Galvanomagnetic Effects and Methods to Investigate Them), Moscow: Radio i Svyaz’, 1990.Google Scholar
- 56.Steele, M.C. and Vural, B., Wave Interactions in Solid State Plasmas, New York: McGraw-Hill, 1969. Translated under the title Vzaimodeistvie voln v plazme tverdogo tela, Moscow: Atomizdat, 1973.Google Scholar
- 57.Lampert, M.A. and Mark, P., Current Injection in Solids, New York: Academic, 1970. Translated under the title Inzhektsionnye toki v tverdykh telakh, Moscow: Mir, 1973.Google Scholar
Copyright information
© MAIK “Nauka/Interperiodica” 2005