Chromia Scale Thermally Grown on Pure Chromium Under Controlled p(O2) Atmosphere: II—Spallation Investigation Using Photoelectrochemical Techniques at a Microscale
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Pure chromium oxidized at 900 °C at low oxygen partial pressure (10−12 atm) gives duplex Cr2O3 scale with an internal part made of equiaxed grains and exhibiting an n-type conduction, and an external part made of columnar grains and exhibiting a p-type conduction. Spalled regions occurring during cooling have been studied with photoelectrochemical techniques at a microscale. New information in the form of a specific image (structural quality image) could be obtained and revealed a level of structural defect density in the internal chromia subscale higher than that measured in the non-spalled region. The results complement the spallation scenario proposed in part I of this work.
KeywordsChromia Photoelectrochemistry Spallation
This work has benefited from the support of the PSEUDO project of the French National Research Agency (ANR) and was performed within the framework of the Centre of Excellence of Multifunctional Architectured Materials “CEMAM” n°AN-10-LABX-44-01 funded by the “Investments for the Future” Program. Special acknowledgments are given to Gilles Renou for his precious help on TEM microscope.
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