Chromia Scale Thermally Grown on Pure Chromium Under Controlled p(O2) Atmosphere: II—Spallation Investigation Using Photoelectrochemical Techniques at a Microscale

  • L. Latu-Romain
  • Y. Parsa
  • S. Mathieu
  • M. Vilasi
  • Y. Wouters
Original Paper
  • 16 Downloads

Abstract

Pure chromium oxidized at 900 °C at low oxygen partial pressure (10−12 atm) gives duplex Cr2O3 scale with an internal part made of equiaxed grains and exhibiting an n-type conduction, and an external part made of columnar grains and exhibiting a p-type conduction. Spalled regions occurring during cooling have been studied with photoelectrochemical techniques at a microscale. New information in the form of a specific image (structural quality image) could be obtained and revealed a level of structural defect density in the internal chromia subscale higher than that measured in the non-spalled region. The results complement the spallation scenario proposed in part I of this work.

Keywords

Chromia Photoelectrochemistry Spallation 

Notes

Acknowledgements

This work has benefited from the support of the PSEUDO project of the French National Research Agency (ANR) and was performed within the framework of the Centre of Excellence of Multifunctional Architectured Materials “CEMAM” n°AN-10-LABX-44-01 funded by the “Investments for the Future” Program. Special acknowledgments are given to Gilles Renou for his precious help on TEM microscope.

References

  1. 1.
    F. Atmani, Y. Wouters, A. Galerie and J.-P. Petit, Materials Science Forum 595–598, 571 (2008).CrossRefGoogle Scholar
  2. 2.
    Y. Wouters, A. Galerie and J.-P. Petit, Materials at High Temperatures 26, 9 (2009).CrossRefGoogle Scholar
  3. 3.
    L. Marchetti, S. Perrin, Y. Wouters, F. Martin and M. Pijolat, Electrochimica Acta 55, 5384 (2010).CrossRefGoogle Scholar
  4. 4.
    A. Srisrual, J.-P. Petit, Y. Wouters, C. Pascal and A. Galerie, Materials at High Temperatures 28, 349 (2011).CrossRefGoogle Scholar
  5. 5.
    W. W. Gärtner, Physical Review 116, 84 (1959).CrossRefGoogle Scholar
  6. 6.
    M. A. Butler, Journal of Applied Physics 48, 1914 (1977).CrossRefGoogle Scholar
  7. 7.
    H. E. Evans and M. P. Taylor, Surface and Coatings Technology 94–95, 27 (1997).CrossRefGoogle Scholar
  8. 8.
    Y. Marfaing in Interface Semi-Conducteur/Electrolyte (Ecole CNRS Aussois, 1984), pp. 35–47.Google Scholar
  9. 9.
    Y. Wouters, A. Galerie, P. Bouvier, M. Mermoux and J.-P. Petit, Materials at High Temperatures 22, 315 (2005).CrossRefGoogle Scholar
  10. 10.
    Y. Wouters, L. Marchetti, A. Galerie and J.-P. Petit, Corrosion Science 50, 1122 (2008).CrossRefGoogle Scholar
  11. 11.
    Y. Wouters, J.-P. Petit and A. Galerie, Solid State Ionics 104, 89 (1997).CrossRefGoogle Scholar
  12. 12.
    A. Galerie, Y. Wouters and J.-P. Petit, Materials Science Forum 251–254, 113 (1997).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC, part of Springer Nature 2018

Authors and Affiliations

  1. 1.CNRS, SIMaPUniversité Grenoble AlpesGrenobleFrance
  2. 2.IJLUniversité de LorraineNancyFrance

Personalised recommendations