Oxidation of Metals

, Volume 82, Issue 5–6, pp 457–467 | Cite as

Interfacial Solute Segregation in the Thermally Grown Oxide of Thermal Barrier Coating Structures

  • Yimeng Chen
  • Roger C. Reed
  • Emmanuelle A. MarquisEmail author
Original Paper


Atom probe tomography is used to measure interfacial and grain boundary segregation in the thermally grown oxide layers found on thermal barrier coatings formed by isothermal heat treatments at 1,100 °C. Segregation of Zr, Hf, Y, and minor elements at the metal/oxide interfaces, oxide grain boundaries and oxide dislocations are observed, quantified and rationalised. The implications of the findings are discussed.


Thermal barrier coating Segregation Atom probe tomography Grain boundary Dislocations 



This work was partly supported by The University of Michigan College of Engineering.


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Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • Yimeng Chen
    • 1
  • Roger C. Reed
    • 2
  • Emmanuelle A. Marquis
    • 1
    Email author
  1. 1.Department of Materials Science and EngineeringUniversity of MichiganAnn ArborUSA
  2. 2.Department of MaterialsUniversity of OxfordOxfordUK

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