Three-Dimensional Damage Evolution Measurement in EB-PVD TBCs Using Synchrotron Laminography
This study provides the first results of three dimensional microstructural evolution analysis of a typical EB-PVD thermal barrier coating subjected to thermal cycling. Results have been obtained using the technique of synchrotron-radiation computed laminography (SRCL), enabling the scanning of samples that are thin but extended in two dimensions. A correlation with quantitative measurements of phase transformation from β-NiAl to γ’-Ni3Al was achieved from 3D images and 2D cross-section analysis. Morphological features of phase transformation and damaged areas within the bond-coat layer obtained by SRCL are discussed.
KeywordsEB-PVD Synchrotron computed laminography Thermal cycling 3D morphology of Ni3Al
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