Three-Dimensional Damage Evolution Measurement in EB-PVD TBCs Using Synchrotron Laminography
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This study provides the first results of three dimensional microstructural evolution analysis of a typical EB-PVD thermal barrier coating subjected to thermal cycling. Results have been obtained using the technique of synchrotron-radiation computed laminography (SRCL), enabling the scanning of samples that are thin but extended in two dimensions. A correlation with quantitative measurements of phase transformation from β-NiAl to γ’-Ni3Al was achieved from 3D images and 2D cross-section analysis. Morphological features of phase transformation and damaged areas within the bond-coat layer obtained by SRCL are discussed.
KeywordsEB-PVD Synchrotron computed laminography Thermal cycling 3D morphology of Ni3Al
Steve Duvinage and Matthieu Rambaudon (Centre des Matériaux) are gratefully acknowledged for specimen preparation and thermal cycling experiment. Pierre Sallot (Centre des Matériaux/Safran) is also acknowledged for precious advice given for specimen preparation for optical observations.
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