Optical and Quantum Electronics

, Volume 40, Issue 14–15, pp 1255–1260 | Cite as

Simulation and design consideration of photoresponse for HgCdTe infrared photodiodes

Article

Abstract

We report on 2D numerical simulations of photoresponse characteristic for long-wavelength HgCdTe infrared photodiodes. Effects of thickness of absorption layer on the photoresponse have been investigated. Optimal thickness of absorption layers at different absorption lengths and diffusion lengths are extracted numerically. An empirical formula is proposed to predict reasonable optimal thickness of absorption layer by theoretically analyzing its correlations with absorption lengths and diffusion lengths.

Keywords

Numerical simulation Design HgCdTe infrared photodiode Photoresponse 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Bellotti, E., Orsogna, D.D.: Numerical analysis of HgCdTe simultaneous two-color photovoltaic infrared detectors. IEEE Journal of Quantum Electronics. 42, 418–426 (2006)CrossRefADSGoogle Scholar
  2. Device simulator Sentaurus Device (former ISE-DESSIS) Ver. 2007. 03.Google Scholar
  3. Gopal V., Dhar V.: Resistance-area product of diodes in a long-wavelength infrared HgCdTe mosaic array. Infrared Phys. Technol. 43, 51–59 (2002). doi: 10.1016/S1350-4495(01)00116-5 CrossRefADSGoogle Scholar
  4. Hu W.D., Chen X.S., Quan Z.J., Xia C.S., Lu W., Yuan H.J.: Demonstration and dynamic analysis of trapping of hot electrons at gate edge model for current collapse and gate lag in GaN-based high-electron-mobility transistor including self-heating effect. Appl. Phys. Lett. 89, 243501.1–243501.3 (2006). doi: 10.1063/1.2405416 Google Scholar
  5. Jo N.H., Yoo S.D., Ko B.G., Lee S.W., Jang J., Lee S.D., Kwack K.D.: Two-dimensional numerical simulation of HgCdTe infrared detectors. SPIE 3436, 50–60 (1998). doi: 10.1117/12.328063 CrossRefADSGoogle Scholar
  6. Jozwikowska A., Jozwikowski K., Antoszewski J., Musca C.A., Nguyen T., Sewell R.H., Dell J.M., Faraone L., Orman Z.J.: Generation-recombination effects on dark currents in CdTe-passivated midwave infrared HgCdTe photodiodes. Appl. Phys. 98, 014504–0145011 (2005). doi: 10.1063/1.1946201 CrossRefGoogle Scholar
  7. Quan Z.J., Li Z.F., Hu W.D., Ye Z.H., Hu X.N., Lu W.: Parameter determination from resistance-voltage curve for long-wavelength HgCdTe photodiode. J. Appl. Phys. 100, 084503–084506 (2006). doi: 10.1063/1.2358411 CrossRefADSGoogle Scholar
  8. Quan Z.J., Chen X.S., Hu W.D., Ye Z.H., Hu X.N., Li Z.F., Lu W.: Modeling of dark characteristics for long-wavelength HgCdTe photodiode. Opt. Quantum Electron. 38, 1107–1113 (2007). doi: 10.1007/s11082-006-9046-4 CrossRefGoogle Scholar
  9. Shen S.C.: Comparison and competition between MCT and QW structure material for use in IR detectors. Microelectron. J. 25, 713–739 (1994). doi: 10.1016/0026-2692(94)90136-8 CrossRefGoogle Scholar
  10. Wenus, J., Rutkowski, J., Rogalski, A.: Two-dimensional analysis of double-layer heterojunction HgCdTe photodiodes. IEEE Transactions on Electron Devices 48, 1326–1332 (2001)CrossRefADSGoogle Scholar
  11. Williams G.M., Dewames R.E.: Numerical simulation of HgCdTe detector characteristics. J. Electron. Mater. 24, 1239–1248 (1995). doi: 10.1007/BF02653080 CrossRefADSGoogle Scholar
  12. Xia C.S., Hu W.D., Wang C., Li Z.F., Chen X.S., Lu W., Simon Li Z.M., Li Z.Q.: Simulation of InGaN/GaN multiple quantum well light-emitting diodes with quantum dot model for electrical and optical effects. Opt. Quantum Electron. 38, 1007–1110 (2007). doi: 10.1007/s11082-006-9029-5 CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC. 2009

Authors and Affiliations

  1. 1.National Lab for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of ScienceShanghaiChina

Personalised recommendations