Preparation and properties of Zn0.9Ni0.1O diluted magnetic semiconductor nanoparticles
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With a view to study the structural, electronic, magnetic, and electrical properties of Zn0.9Ni0.1O diluted magnetic semiconductor nanoparticles, systematic investigation has been undertaken. Samples were prepared for the first time by hydrazine-assisted polyol method, and the powders were annealed at various temperatures in order to obtain the samples with different grain sizes. From the Rietveld refined XRD data, lattice parameters, the average crystallite size values, and r.m.s micro-strain values were computed. From the AFM and TEM studies, the average particle sizes were obtained and are found to be in the range 12–46 nm. XPS measurements clearly indicate that the chemical states as +2 for both Zn and Ni ions and are stable with varying annealing temperature. Further, using XPS and optical studies, the electronic structure of the materials was analyzed. A careful phase analysis of the Rietveld refined XRD data (at logarithmic scale) selected area electron diffraction patterns, FTIR, Raman, and XPS studies; it was concluded that all the samples are having hexagonal wurtzite structure without any detectable impurity phases. The optical band gap values are found to exhibit a clear blue shift. The influence of oxygen vacancies on the emission spectra was studied by Photo Luminescence measurement. The magnetization studies were undertaken by VSM, MFM, and FMR techniques and confirmed the presence of clear room temperature ferromagnetism without any magnetic clusters. The carrier concentration (n) values obtained from the thermo power studies are found to decrease with increasing annealing temperature and depend on the local defects which are critically influenced by the annealing temperature and crystallite size of the nanomaterials.
KeywordsNanoparticles Optical band gap RT ferromagnetism Diluted magnetic Semiconductors Carrier concentration Synthesis
The authors thank DRDO (ER & IPR), New Delhi, for providing financial assistance through a research project and also thank Materials Research Center, Indian Institute of Technology of Madras, Chennai for providing facilities TEM, Raman, and XPS studies.
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