Molecular mapping of resistance gene to the English grain aphid, Sitobion avenae, in a Chinese wheat line XN98-10-35
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Abstract
The English grain aphid, Sitobion avenae (F.), is a destructive pest in common wheat (Triticum aestivum L.), and it appears in wheat production regions of China and other areas worldwide. Breeding resistant varieties are considered the most effective, economical and environmentally friendly approach to control S. avenae. The synthetic hexaploid wheat line XN98-10-35 showed resistant to S. avenae at all growth stages. To study the genetic control of the aphid resistance, XN98-10-35 was crossed with the susceptible line XN1376. A single dominant resistance gene was detected in BC1, F2, F2:3 and F3:4 genetic populations, temporarily designated as Sa2. By testing 180 F2 plants, 71 F2:3 lines and 16 BC1 plants, the resistance gene in XN98-10-35 was found to be closely linked to the simple sequence repeat markers Xgwm350 and Xbarc70 on wheat chromosome 7DS (deletion line 7DS-5) at genetic distances of 4.7 and 8.9 cM, respectively. It is concluded that Sa2 is a new resistance gene to S. avenae. Our study suggested that the two markers linked to Sa2 can be used in marker-assisted selection to develop new cultivars with resistance to S. avenae.
Keywords
Triticum aestivum L. Sitobion avenae Simple sequence repeat (SSR) markerNotes
Acknowledgments
We are grateful to for the critical review of this manuscript by Dr. Susanne Dreisigacker, Dr. Hao Yuanfeng and Dr. Gordon Huestis. This work was supported by Chinese National Programs for High Technology Research and Development (2009AA101102), The Key Scientific and Technological Innovation Special Projects of Shaanxi “13115”(No. 2007ZDKG-020) and Top Talents Plan Projects of Northwest A&F University. Funded projects of agricultural cooperation between China and Germany [2008/2009(04)], Talents Funds of Henan university of science and technology (09001595).
Supplementary material
References
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