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A Device for Calibration of Electronic Speckle Pattern Interferometers

  • A. D. IvanovEmail author
  • V. L. Minaev
  • G. N. Vishnyakov
  • G. G. Levin
MECHANICAL MEASUREMENTS
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A calibration device intended for metrological assurance of instruments used to measure deformations and displacements by methods of electronic speckle interferometry and shearography is developed. The optical methods presented here may be applied to different types of materials possessing rough surfaces. The proposed device reproduces stress-strain states by means of elastic deformation of the surface of a membrane through the use of a rod and leverage. Calibration of the device is performed, its transfer characteristics are investigated, and the nonlinearity of the displacement of the surface of the membrane is estimated. Results of experiments designed to measure the stress-strain state with the use of the noncontact method of shearography are presented. The phase image produced by deformation of the membrane is described and the metrological characteristics of the calibrated device are estimated. It is shown that through the use of the present calibration device it is possible to use optical methods not only for qualitative assessment of the deformation of objects of complex shape, but also for quantitative estimation of the geometric characteristics of these objects.

Keywords

deformation stress-strain state electronic speckle pattern interferometry flaw detection speckle pattern calibration noncontact measurements 

References

  1. 1.
    W. Steinchen and L. Wang, Digital Shearography. Theory and Application of Digital Speckle Pattern Shearing Interferometry, SPIEPress, Bellingham (2003).Google Scholar
  2. 2.
    X. Xie, N. Xu, J. Sun, et al., “Simultaneous measurement of deformation and the first derivative with spatial phaseshift digital shearography,” Opt. Communic., 286, 277–281 (2013), DOI: 10:1016/j.optcom.2012.08.072.Google Scholar
  3. 3.
    U. Schars and W. Jueptner, Digital Holography. Digital Hologram Recording, Numerical Reconstruction, and Related Techniques, Springer-Verlag, Berlin-Heidelberg (2005). Google Scholar
  4. 4.
    W. Xiaoqing and K. Chou, “Residual stress in metal parts produced by powder-bed additive manufactured processes,” in: Proc. 26th Int. Solid Freedom Fabrication Symposium (2015), pp. 1463–1474.Google Scholar
  5. 5.
    S. Waldner and N. Goudermand, “Quantitative strain analysis with image shearing speckle pattern interferometry,” in: Interferometry in Speckle Light, P. Jacquot and J. M. Fournier (eds.), Springer, Berlin, Heidelberg (2000), https:// doi.org/10.1007/978-3-642-57323-1_40.CrossRefGoogle Scholar
  6. 6.
    L. Lobanov, V. Pivtorak, V. Savitsky, and G. Tkachuk, “Determination of residual stress in structural elements using the electron speckle interferometry method,” in: 13th Int. Conf. on Fracture, Beijing, China, June 16–21, 2013.Google Scholar
  7. 7.
    R. V. Goldstein, V. M. Kozintsev, and A. L. Popov, “Using an electronic speckle interferometer for measurement of a stress-deformation state of elastic bodies and structures,” Recent Adv. Mech., 191–206 (2009), DOI: 10:1007/ 978-94-007-0557-9_11.Google Scholar
  8. 8.
    J. Zhang and T. C. Chong, “Fiber electronic speckle pattern interferometry and its applications in residual stress measurements,” Appl. Opt., 37, No. 28, 6707–6715 (1998), DOI: http://doi.org. https://doi.org/10.1364/AO.37/006707.
  9. 9.
    US Patent No. 07/266,616, subm. Nov. 3, 1988, NCBI, PubChem Database, Patents-US4940318, https://pubchem.ncbi.nlm.nih.gov/patent/US4940318, acc. Aug. 26, 2019.Google Scholar
  10. 10.
    O. A. Zhuravlev, S. Yu. Komarov, and R. N. Sergeev, “Loading device for testing mobile digital speckle interferometers of deformative displacements,” Vest. SaMGU, 9/2, No. 110, 87–96 (2013).Google Scholar
  11. 11.
    G. G. Levin, V. L. Minaev, A. D. Ivanov, and G. N. Vishnyakov, Patent 187416 RF, “Device for reproduction of stress-strain states,” Claim 2018141304, subm. Nov. 23, 2018, publ. March 5, 2019, Polezn. Modeli, No. 7 (2019).Google Scholar
  12. 12.
    G. N. Vishnyakov, V. L. Minaev, and A. D. Ivanov, “Electronic speckle interferometry by the phase step method,” in: Holography. Science and Practice: Proc. 15th Int. Sci. Techn. Conf. (2018), pp. 309–311.Google Scholar

Copyright information

© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  • A. D. Ivanov
    • 1
    Email author
  • V. L. Minaev
    • 1
  • G. N. Vishnyakov
    • 1
    • 2
  • G. G. Levin
    • 1
  1. 1.All-Russia Research Institute of Optophysical Measurements (VNIIOFI)MoscowRussia
  2. 2.Bauman Moscow State Technical University (BMSTU)MoscowRussia

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