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Measurement of the Energy Resolution of Silicon X-Ray Detectors Using Absorption Edge Spectra

  • S. M. OsadchiiEmail author
  • A. A. Petukhov
  • V. B. Dunin
IONIZING RADIATION MEASUREMENTS
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A silicon detector with a longitudinal silicon wafer has been developed. x-Ray spectra at the K-absorption edges of Au, Pb, and Bi are used to measure its energy resolution. The results are compared with measurements based on x-rays from a 241Am gamma-ray source. The dependence of the energy resolution of the detector on the noise of a charge-sensitive amplifier and on statistical fluctuations in pair production of carriers in the silicon is calculated.

Keywords

Si-pin-detector detector energy resolution x-rays gamma-ray source 

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Copyright information

© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  • S. M. Osadchii
    • 1
    Email author
  • A. A. Petukhov
    • 1
  • V. B. Dunin
    • 2
  1. 1.All-Russia Research Institute of Physicotechnical and Radio Measurements (VNIIFTRI)Moscow RegionRussia
  2. 2.Joint Institute for Nuclear Research (JINR)Moscow RegionRussia

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