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Measurement Techniques

, Volume 61, Issue 12, pp 1222–1227 | Cite as

Analysis and Synthesis of Methods for Measuring the S-Parameters of Microwave Transistors

  • S. V. Savel’kaevEmail author
  • V. A. Litovchenko
Article
  • 4 Downloads

Two-signal and modified two-signal methods for measuring the S-parameters of transistors are examined, along with a method developed for adequate measurement based on these methods. The uncertainty of the last two methods is eliminated. The methods are implemented using a simulator-analyzer for the amplifiers and microwave self-oscillators in measurement channels of the simulator-analyzer that are matched and unmatched to the loads. The range of applicability and the interrelationship of these methods are studied and their advantages and disadvantages are pointed out.

Keywords

methods for measuring the S-parameters of passive and active four-pole systems matrix of S-parameters relationship of matrix components adequate measurement 

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Copyright information

© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  1. 1.Siberian State University of Geosystems and TechnologiesNovosibirskRussia

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