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Measurement Techniques

, Volume 58, Issue 12, pp 1347–1353 | Cite as

Optoelectronic Measurement System for a High-Temperature Dilatometer

  • I. G. Bronshtein
  • F. M. Inochkin
  • S. K. Kruglov
  • T. A. Kompan
  • S. V. Kondrat’ev
  • A. S. Korenev
  • N. F. Pukhov
Article

A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters during the measurement process. Experimental results are reported.

Keywords

high-temperature dilatometer optoelectronic system paired telemicroscopy coefficient of linear thermal expansion 

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Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  • I. G. Bronshtein
    • 1
  • F. M. Inochkin
    • 2
  • S. K. Kruglov
    • 2
  • T. A. Kompan
    • 3
  • S. V. Kondrat’ev
    • 3
  • A. S. Korenev
    • 3
  • N. F. Pukhov
    • 3
  1. 1.St. Petersburg National Research University of Information Technologies, Mechanics, and Optics (ITMO)St. PetersburgRussia
  2. 2.St. Petersburg Polytechnic UniversitySt. PetersburgRussia
  3. 3.Mendeleev All-Russia Institute of Metrology (VNIIM)St. PetersburgRussia

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