Measurement of the Local Emf of Metals by Scanning Tunnel Spectroscopy
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This is a study of the tunneling current-voltage characteristics of metallic samples of Au, Pt, and Pd at room temperature. At low voltages (V = ±0.1 V) the tunneling current has a linear dependence on the applied potential difference between the probe and sample and its slope differs for different samples. An original contactless method is proposed for measuring the local thermal emf of metallic samples and nanoclusters on substrate surfaces.
Keywordsnanoclusters thermal emf scanning tunnel microscopy Zeebeck effect
This work was supported by the Russian Foundation for Basic Research (Grant No. 12-08-01098) and the Ministry of Education and Science of the Russian Federation through Grant Nos. 14.A18.21.1107 and 14.A18.21.0939 for the Federal Targeted Program on Scientific and Teaching Staff for an Innovative Russia in 2009–2013.
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