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Measurement Techniques

, Volume 57, Issue 8, pp 855–859 | Cite as

Measurement of the Local Emf of Metals by Scanning Tunnel Spectroscopy

  • V. I. TroyanEmail author
  • P. V. Borisyuk
  • O. S. Vasil’ev
  • A. V. Krasavin
  • V. V. Florentsev
Article

This is a study of the tunneling current-voltage characteristics of metallic samples of Au, Pt, and Pd at room temperature. At low voltages (V = ±0.1 V) the tunneling current has a linear dependence on the applied potential difference between the probe and sample and its slope differs for different samples. An original contactless method is proposed for measuring the local thermal emf of metallic samples and nanoclusters on substrate surfaces.

Keywords

nanoclusters thermal emf scanning tunnel microscopy Zeebeck effect 

Notes

This work was supported by the Russian Foundation for Basic Research (Grant No. 12-08-01098) and the Ministry of Education and Science of the Russian Federation through Grant Nos. 14.A18.21.1107 and 14.A18.21.0939 for the Federal Targeted Program on Scientific and Teaching Staff for an Innovative Russia in 2009–2013.

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Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • V. I. Troyan
    • 1
    Email author
  • P. V. Borisyuk
    • 1
  • O. S. Vasil’ev
    • 1
  • A. V. Krasavin
    • 1
  • V. V. Florentsev
    • 1
  1. 1.National Research Nuclear University MEPhI (Moscow Engineering Physics Institutemisis)MoscowRussia

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