On the relationship between the stress intensity factors and the far field of SH-waves diffracted on interface cracks
Diagnostics and Nondestructive Testing of Materials and Structures
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By using the Wiener–Hopf method, we solve the problem of diffraction of plane SH-waves on semiinfinite interface cracks and deduce the relationships between the radiation field in fixed directions and the stress intensity factors. The dependence of the stress intensity factors on the field of displacements scattered in the plane perpendicular to the crack tip is analyzed. It is shown that the ratio of the stress intensity factors can be represented via the ratio of the scattered far fields measured for various angles and frequencies of sounding.
Keywords
Wiener–Hopf method stress intensity factors (SIF) diffraction semiinfinite crack scattered fieldPreview
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References
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