Journal of Sol-Gel Science and Technology

, Volume 81, Issue 1, pp 294–302 | Cite as

Sol-gel preparation and structural investigations of silico-phosphate glasses doped with Fe ions

  • Bogdan Alexandru C. Sava
  • Mihail Elisa
  • Lucica Boroica
  • Victor Kuncser
  • Mihaela Valeanu
  • Ileana Cristina Vasiliu
  • Ionut Feraru
  • Raluca Iordanescu
Original Paper: Sol-gel and hybrid materials for optical, photonic and optoelectronic applications
  • 146 Downloads

Abstract

Different aspects related to the sol-gel preparation and structural investigation of silico-phosphate glasses (SiO2–P2O5 system) doped with Fe ions are reported. During the preparation process, tetraethoxysilane was used as a precursor for SiO2 and phosphoric acid (H3PO4-HP) for P2O5. Ferric chloride was used as precursor for Fe ions, water as reagent for hydrolysis reaction and ethylic alcohol as solvent. The pH of the sols was modified by adding hydrochloric acid and ammonia. It was observed that a slight increase of the solution temperature (up to 40 °C) allows a drastic decrease of the gelation time (from days to hours). The structure of the obtained powders dried in air at room temperature and at 100 °C for 10 h and subsequently thermally treated at different temperatures was investigated by Fourier transformed infrared (FTIR) and Raman spectroscopy. Vibration modes specific to Si–O–Et, Si–OH, P–O–P, P–O–Si, hydrogen bonds and H2O, as well as combined modes have been observed. The local structure and electron configurations of the doping Fe ions have been investigated by 57Fe Mössbauer spectroscopy.

Graphical Abstract

Mössbauer spectra of the sample with molar composition 0.85SiO2 0.08P2O5 0.07Fe2O3 (Fe15) annealed at 300 °C collected at 5.7/6 K, 30 K, 60 K and at room temperature

The magnetic pattern is assigned (by its hyperfine parameters) to α-Fe2O3 (36 % from total Fe, the rest being dispersed in the matrix as paramagnetic Fe with octahedral oxygen configuration).Open image in new window

Keywords

Sol-gel Silico-phosphate glass Fe ions FTIR Raman Mossbauer 

Notes

Acknowledgments

The authors are grateful to Executive Unity for Financing of Higher Education, Research and Innovation, Romania, for the financial support in the frame of PNII 186/2012 Project from Partnership Program, MNT-ERA.NET SENSGLASS 7-031/2011 project and M-ERA.NET MAGPHOGLAS 7-081/2013. Authors from INCDFM acknowledge the financial support through the Core Program 2016–2017, project 3.

Compliance with ethical standards

Conflict of interest

The authors declare that they have no conflict of interests.

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Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  1. 1.National Institute for Laser, Plasma and Radiation PhysicsMagureleRomania
  2. 2.National Institute of R & D for Optoelectronics INOE 2000MagureleRomania
  3. 3.National Institute of Materials PhysicsMagureleRomania

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