Formation of cerium titanate, CeTi2O6, in sol–gel films studied by XRD and FAR infrared spectroscopy
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The process of formation of cerium titanate films as a function of annealing temperature and composition has been studied by combining X-ray diffraction analysis and far infrared spectroscopy. The films have been prepared by a sol–gel synthesis using metal chlorides as precursors; the synthesis allows obtaining cerium titanate films upon annealing in air. A brannerite type, CeTi2O6, phase has been identified by X-ray diffraction and Rietveld analysis on thin films. CeTi2O6 is formed upon annealing at 700 °C and in a limited range of ceria-titania mixed compositions. The far infrared spectra are useful to observe the formation of crystalline phases at the beginning of the crystallization process at lower firing temperatures, when the XRD analysis is not enough sensitive.
KeywordsCerium titanate Titanates Thin films Far infrared spectroscopy X-ray diffraction
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