Journal of Statistical Physics

, Volume 122, Issue 6, pp 1261–1291

Thin-Film Flow Influenced by Thermal Noise

Article

DOI: 10.1007/s10955-006-9028-8

Cite this article as:
Grün, G., Mecke, K. & Rauscher, M. J Stat Phys (2006) 122: 1261. doi:10.1007/s10955-006-9028-8

Abstract

We study the influence of thermal fluctuations on the dewetting dynamics of thin liquid films. Starting from the incompressible Navier-Stokes equations with thermal noise, we derive a fourth-order degenerate parabolic stochastic partial differential equation which includes a conservative, multiplicative noise term—the stochastic thin-film equation. Technically, we rely on a long-wave-approximation and Fokker–Planck-type arguments. We formulate a discretization method and give first numerical evidence for our conjecture that thermal fluctuations are capable of accelerating film rupture and that discrepancies with respect to time-scales between physical experiments and deterministic numerical simulations can be resolved by taking noise effects into account.

Key Words

wetting microfluidics thin film flow stochastic hydrodynamics 

Copyright information

© Springer Science + Business Media, Inc. 2006

Authors and Affiliations

  1. 1.Institut für Angewandte MathematikUniversität BonnBonnGermany
  2. 2.Institut für Theoretische PhysikUniversität Erlangen-NürnbergErlangenGermany
  3. 3.Max-Planck-Institut für MetallforschungStuttgartGermany
  4. 4.ITAPUniversität StuttgartStuttgartGermany

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