Journal of Superconductivity and Novel Magnetism

, Volume 31, Issue 10, pp 3217–3222 | Cite as

Influence of Thickness on the Structural, Optical and Magnetic Properties of Bismuth Ferrite Thin Films

  • Hamed MalekiEmail author
  • Shahrzad Falahatnezhad
  • Majid Taraz
Original Paper


In this paper, the effect of thickness on the structural, optical, and magnetic properties of the BiFeO3 (BFO) thin films formed on a glass substrate by the chemical solution deposition has been studied. The sol-gel method combined by the spin-coating technique is used to fabricate BFO thin films. The XRD analysis indicated that BFO thin films had a rhombohedral perovskite structure. Polycrystallinity, smooth and compact surface morphology, and uniform size distribution, as well as average thickness of layers, were observed in FESEM images. UV-vis spectra showed that the absorption coefficient and energy bandgap increased by increasing the thickness of films. VSM measurements indicated that the thin films showed a behavior between weak ferromagnetic and anti-ferromagnetism for all samples.


Sol-gel process Multiferroics Spin coating technique Bismuth ferrite Thin film 


  1. 1.
    Wang, J., Neaton, J.B., Zheng, H., Nagarajan, V., Ogale, S.B., Liu, B., Viehland, D., Vaithyanathan, V., Schlom, D.G., Waghmare, U.V., Spaldin, N.A., Rabe, K.M., Wuttig, M., Ramesh, R.: Science 299, 1719 (2003)ADSCrossRefGoogle Scholar
  2. 2.
    Palkar, V.R., John, J., Pinto, R.: Appl. Phys. Lett. 80, 1628 (2002)ADSCrossRefGoogle Scholar
  3. 3.
    Hill, N.A.: J. Chem. Phys. B 104, 6694 (2000)CrossRefGoogle Scholar
  4. 4.
    Eerenstein, W., Mathur, N.D., Scott, J.F.: Nature 442, 759 (2006)ADSCrossRefGoogle Scholar
  5. 5.
    Ramesh, R., Spaldin, N.A.: Nat. Mater. 6, 21 (2007)ADSCrossRefGoogle Scholar
  6. 6.
    Choi, T., Lee, S., Choi, Y.J., Kiryukhin, V., Cheong, S.W.: Science 324, 63 (2009)ADSCrossRefGoogle Scholar
  7. 7.
    Zhang, Q., Sando, D., Nagarajan, V.: J. Mater. Chem. C 4, 4092 (2016)CrossRefGoogle Scholar
  8. 8.
    Dong, S., Liu, J.M., Cheong, S.W., Ren, Z.F.: Adv. Phys. 64, 519 (2015)ADSCrossRefGoogle Scholar
  9. 9.
    Catalan, G., Scott, J.F.: Adv. Mater. 21, 2463 (2009)CrossRefGoogle Scholar
  10. 10.
    Gao, F., Chen, X.Y., Yin, B.K., Dong, S., Ren, Z.F., Yuan, F., Yu, T., Zou, Z.G., Lui, J.M.: Adv. Mater. 19, 2889 (2007)CrossRefGoogle Scholar
  11. 11.
    Scott, J.F.: J. Mat. Chem. 22, 4567 (2012)CrossRefGoogle Scholar
  12. 12.
    Zhao, T., Scholl, A., Zavaliche, F., Lee, K., Barry, M., Doran, A., Cruz, M.P., Chu, Y.H., Ederer, C., Spaldin, N.A., Das, R.R., Kim, D.M., Baek, S.H., Eom, C.B., Ramesh, R.: Nat. Mater. 5, 823 (2006)ADSCrossRefGoogle Scholar
  13. 13.
    Liu, H, Yang, X.: Ferroelectrics 507, 69 (2017)CrossRefGoogle Scholar
  14. 14.
    Pabst, G.W., Martin, L.W., Chu, Y.H., Ramesh, R.: Appl. Phys. Lett. 90, 072902 (2007)ADSCrossRefGoogle Scholar
  15. 15.
    Ramazanoglu, M., Ratcliff, W., Choi, Y.J., Lee, S., Cheong, S.W., Kiryukhin, V.: Phys. Rev. B 83, 174434 (2011)ADSCrossRefGoogle Scholar
  16. 16.
    Xu, X., Lin, Y.H., Li, P., Shu, L., Nan, C.W.: J. Am. Ceram. Soc. 94, 2296 (2011)CrossRefGoogle Scholar
  17. 17.
    Jang, H.W., Baek, S. H., Ortiz, D., Folkman, C.M., Das, R.R., Ramesh, R.: Phys. Rev. Lett. 101, 107602 (2008)ADSCrossRefGoogle Scholar
  18. 18.
    Ederer, C., Spaldin, N.A.: Phys. Rev. B 71(R), 060401 (2005)ADSCrossRefGoogle Scholar
  19. 19.
    Lebeugle, D., Colson, D., Forget, A., Viret, M., Bonville, P., Marucco, J.F., Fusil, S.: Phys. Rev. B 76, 024116 (2007)ADSCrossRefGoogle Scholar
  20. 20.
    Lubk, A., Gemming, S., Spaldin, N.A.: Phys. Rev. B 80, 104110 (2009)ADSCrossRefGoogle Scholar
  21. 21.
    Ravindran, P., Vidya, R., Kjekshus, A., Fjellvag, H., Eriksson, O.: Phys. Rev. B 74, 224412 (2006)ADSCrossRefGoogle Scholar
  22. 22.
    Scott, J.F.: J. Magn. Magn. Mater. 321, 1689 (2009)ADSCrossRefGoogle Scholar
  23. 23.
    Jha, P.K., Jha, P.A., Srivastava, G., Jha, A.K., Kotnala, R.K., Dwivedi, R.K.: J. Magn. Magn. Mater. 349, 95 (2014)ADSCrossRefGoogle Scholar
  24. 24.
    Sun, Y., Sun, Z., Wei, R., Huang, Y., Wang, L., Leng, J., Xiang, P., Lan, M.: J. Magn. Magn. Mater. 449, 10 (2018)ADSCrossRefGoogle Scholar
  25. 25.
    Ihlefeld, J.F., Kumar, A., Gopalan, V., Schlom, D.G., Chen, Y.B., Pan, X.Q., Heeg, T., Schubert, J., Ke, X., Schiffer, P., Orenstein, J., Martin, L.W., Chu, Y.H., Ramesh, R.: Appl. Phys. Lett. 91, 071922 (2007)ADSCrossRefGoogle Scholar
  26. 26.
    Kim, D.H., Aimon, N.M., Sun, X.Y., Kornblum, L., Walker, F.J., Ahn, C.H., Ross, C.A.: Adv. Funct. Mater. 24, 5889 (2014)CrossRefGoogle Scholar
  27. 27.
    Laughlin, R.P., Currie, D.A., Contreras-Guererro, R., Dedigama, A., Priyantha, W., Droopad, R., Theodoropoulou, N., Gao, P., Pan, X.: J. Appl. Phys. 113, 17D919 (2013)CrossRefGoogle Scholar
  28. 28.
    Deepak, N., Carolan, P., Keeney, L., Zhang, P.F., Pemble, M.E., Whatmore, R.W.: Chem. Mater. 27, 6508 (2015)CrossRefGoogle Scholar
  29. 29.
    Aramaki, M., Kariya, K., Yoshimura, T., Murakami, S., Fujimura, N.: Jpn. J. Appl. Phys. 55, 10TA16 (2016)CrossRefGoogle Scholar
  30. 30.
    Ramirez-Camacho, M.C., Sanchez-Valdes, C.F., Gervacio-Arciniega, J.J., Font, R., Ostos, C., Bueno-Baques, D., Curiel, M., Sanchez-Llamazares, J.L., Siqueiros, J.M., Raymond-Herrera, O.: Acta Materialia 128, 451 (2017)CrossRefGoogle Scholar
  31. 31.
    Mori, T.J.A., Mouls, C.L., Morgado, F.F., Schio, P., Cezar, J.C.: J. Appl. Phys. 122, 124102 (2017)ADSCrossRefGoogle Scholar
  32. 32.
    Zheng, R.Y., Gao, X.S., Zhou, Z.H., Wang, J.: J. Appl. Phys. 101, 054104 (2007)ADSCrossRefGoogle Scholar
  33. 33.
    Cho, S., Jang, J.W., Zhang, W., Suwardi, A., Wang, H., Wang, D., MacManus-Driscoll, J.L.: Chem. Mater. 27, 6635 (2015)CrossRefGoogle Scholar
  34. 34.
    Katiyar, R.K., Sharma, Y., Misra, P., Puli, V.S., Sahoo, S., Kumar, A., Scott, J.F., Morell, G., Weiner, B.R., Katiyar, R.S.: Appl. Phys. Lett. 105, 172904 (2014)ADSCrossRefGoogle Scholar
  35. 35.
    Moniz, S.J.A., Quesada-Cabrera, R., Blackman, C.S., Tang, J., Southern, P., Weaver, P.M., Carmalt, C.J.: J. Mater. Chem. A 2, 2922 (2014)CrossRefGoogle Scholar
  36. 36.
    Yang, S.Y., Zavaliche, F., Mohaddes-Ardabili, L., Vaithyanathan, V., Schlom, D.G., Lee, Y.J., Chu, Y.H., Cruz, M.P., Zhan, Q., Zhao, T., Ramesh, R.: Appl. Phys. Lett. 87, 102903 (2005)ADSCrossRefGoogle Scholar
  37. 37.
    Moniz, S.J.A., Blackman, C.S., Southern, P., Weaver, P.M., Tanga, J., Carmalt, C.J.: Nanoscale 7, 16343 (2015)ADSCrossRefGoogle Scholar
  38. 38.
    Naganuma, H., Okamura, S., Appl, J.: J. Appl. Phys. 101, 09M103 (2007)CrossRefGoogle Scholar
  39. 39.
    Dong, G., Tan, G., Luo, Y., Liu, W., Xia, A., Ren, H.: Appl. Surf. Sci. 305, 55 (2014)ADSCrossRefGoogle Scholar
  40. 40.
    Tomczyk, M., Stroppa, D.G., Reaney, I.M., Vilarinho, P.M.: Phys. Chem. Chem. Phys. 19, 14337 (2017)CrossRefGoogle Scholar
  41. 41.
    Zhang, H.R., Kalantari, K., Marincel, D.M., Trolier-McKinstry, S., MacLaren, I., Ramasse, Q.M., Rainforth, W.M., Reaney, I.M.: Thin Solid Films 616, 767 (2016)ADSCrossRefGoogle Scholar
  42. 42.
    Hu, W.W., Chen, Y., Yuan, H.M., Li, G.H., Qiao, Y., Qin, Y.Y., Feng, S.H.: J. Phys. Chem. C 115, 8869 (2011)CrossRefGoogle Scholar
  43. 43.
    Tyholdt, F., Jorgensen, S., Fjellvag, H., Gunnaes, A.E.: J. Mater. Res. 20, 2127 (2005)ADSCrossRefGoogle Scholar
  44. 44.
    Zhang, Q., Valanoor, N., Standard, O.: J. Mater. Chem. C 3, 582 (2015)CrossRefGoogle Scholar
  45. 45.
    Cullity, B.D., Stock, S.R.: Elements of X ray Diffraction. Prentice Hall, Upper Saddle River (2001)Google Scholar
  46. 46.
    Xu, X.S., Brinzari, T.V., Lee, S., Chu, Y. H., Martin, L.W., Kumar, A., McGill, S., Rai, R.C., Ramesh, R., Gopalan, V., Cheong, S.W., Musfeldt, J.L.: Phys. Rev. B 79, 134425 (2009)ADSCrossRefGoogle Scholar
  47. 47.
    Xu, X.S., Ihlefeld, J.F., Lee, J.H., Ezekoye, O.K., Vlahos, E., Ramesh, R., Gopalan, V., Pan, X.Q., Schlom, D.G., Musfeldt, J.L.: Appl. Phys. Lett. 96, 192901 (2010)ADSCrossRefGoogle Scholar
  48. 48.
    Tauc, J.: Amorphous and Liquid Semiconductors. Plenum, New York (1974)CrossRefGoogle Scholar

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© Springer Science+Business Media, LLC, part of Springer Nature 2018

Authors and Affiliations

  1. 1.Faculty of PhysicsShahid Bahonar University of KermanKermanIran

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