An Iterative Method for Computing the Surface Resistance of YBCO Thin Films in the Nonlinear Regime of RF Power
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A numerical method to find, in the nonlinear regime, the quality factor, the surface resistance, and the resonance frequency of YBCO microstrip line resonator, deposited on both sides of an MgO substrate, is presented. The numerical method is based on an iterative self-consistent technique used to find the RF magnetic field in the nonlinear regime of the dissipation mechanisms. The determination of the RF magnetic field yields to the corresponding surface resistance and resonance frequency. The dependence of the geometrical factor of the film on the RF magnetic field is discussed. This latter is usually used as constant in the literature. However, in our calculation this factor has a maximum at a certain RF input power.
KEYWORDS
Microstrip line Microwave Surface impedance HTS Thin films Nonlinear regimeNotes
ACKNOWLEDGMENTS
This work was financially supported by the Research Affairs at the UAE University, under contract no. 04-02-2-11/03.
REFERENCES
- 1.R. B. Hammond, E. R. Soares, B. A. Willemsen, T. Dahm, D. J. Scalapino, and J. R. Schrieffer, J. Appl. Phys. 84, 5662 (1998).CrossRefADSGoogle Scholar
- 2.Y. M. Hammond, et al., Appl. Phys. Lett. 73, 2200 (1998).CrossRefADSGoogle Scholar
- 3.M. A. Golosovsky, H. J. Snortland, and M. R. Beasley, Phys. Rev. B 51, 6462 (1995).CrossRefADSGoogle Scholar
- 4.M. A. Hein, D. E. Oates, P. J. Hirst, R. G. Humphreys, and A. V. Velichko, Appl. Phys. Lett. 80, 1007 (2002).CrossRefADSGoogle Scholar
- 5.H. Hoshizaki, N. Sakakibara, and Y. Ueno, J. Appl. Phys. 86, 10, 5788 (1999).CrossRefADSGoogle Scholar
- 6.O. G. Vendik, I. B. Vendick, and D. I. Kaparkov, IEEE Trans. Microw. Theory Tech. 46, May, 469 (1998).CrossRefADSGoogle Scholar
- 7.T. Van Duzer and C. W. Turner, Principles of Superconductive Devices and Circuits (New York, Elsevier, 1981).Google Scholar
- 8.J. C. Booth, S. A. Schima, and D. C. DeGroot, IEEE Trans. Appl. Supercond. 13, 2, 315 (2003).CrossRefGoogle Scholar
- 9.I. Vendik, Supercond. Sci. Technol. 13, 974 (2000).CrossRefADSGoogle Scholar
- 10.M. Hein, High-Temperature Superconductor Thin Films at Microwave Frequencies (Springer Tracts in Modern Physics, 1999).Google Scholar
- 11.R. A. Pucel, D. J. Masse, and C. P. Hartwig, IEEE Trans. Microw. Theory Tech. 16, 6, 469 (1968).CrossRefGoogle Scholar
- 12.D. M. Shen, S. M. Ali, D. E. Oates, R. S. Withers, and J. A. Kong, IEEE Trans. Appl. Supercond. 1, June, 108 (1991).CrossRefADSGoogle Scholar
- 13.L. H. Lee, S. M. Ali, and W. G. Lyons, IEEE Trans. Appl. Supercond. 2, June, 49 (1992).CrossRefADSGoogle Scholar
- 14.B. Cabon, T. Vu Dinh, and J. Chilo, IEEE Trans. Magn. 31, May, 1570 (1995).CrossRefADSGoogle Scholar
- 15.E. Zeldov, J. R. Clem, M. McElfresh, and M. J. Darwin, Phys. Rev. B 49, 9802 (1994).CrossRefADSGoogle Scholar
- 16.J. Fang, X. J. Xu, J. Z. Shi, and X. W. Cao, Physica C 246, 119 (1995).ADSCrossRefGoogle Scholar
- 17.C. Ferdeghini, E. Giannini, G. Grassano, D. Marre, I. Pallecchi, and A. S. Siri, Physica C 294, 233 (1998).ADSCrossRefGoogle Scholar
- 18.P. Fournier, Analysis of Inter-Grains Vortex Pinning of YBCO Poly-Crystals, PhD Thesis, Sherbrooke University Canada (1993).Google Scholar
- 19.K.-H. Muller, E. E. Mitchell, J. Herrmann, D. B. Lowe, C. Andrikidis, A. J. Thorley, C. Foley, and N. Savvides, Physica C 366, 245 (2002).ADSCrossRefGoogle Scholar
- 20.J. Halbritter, J. Appl. Phys. 41, 4581 (1970).CrossRefADSGoogle Scholar
- 21.J. Halbritter, K. Numssen, and E. Gaganidze, IEEE Trans. Appl. Supercond. 11, 3541 (2001).CrossRefGoogle Scholar
- 22.C. Wilker, Z.-Y. Shen, P. Pang, D. W. Face, W. L. Holstein, A. L. Matthews, and D. B. Laubacher, IEEE Trans. Microw. Theory Tech. 39, 9, 1462 (1991).CrossRefADSGoogle Scholar
- 23.J. F. Liu, et al., Appl. Phys. Lett. 73, 23, 3450 (1998).CrossRefADSGoogle Scholar
- 24.P. P. Nguyen, D. E. Oates, G. Dresselhaus, and M. S. Dresselhaus, Phys. Rev. B 48, 6400 (1993).CrossRefADSGoogle Scholar
- 25.A. M. Portis, D. W. Cooke, and H. Piel, Physica C 162–164, 1547 (1989).Google Scholar
- 26.R. Pinto, R. Kumar, N. Goyal, P. R. Apte, S. P. Pai, and S. K. Malik, Solid State Commun. 84, 12, 1107 (1992).CrossRefADSGoogle Scholar