Journal of Russian Laser Research

, Volume 32, Issue 1, pp 12–18 | Cite as

On-line determination of average grain size of polycrystalline silicon from melt duration of molten silicon

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Abstract

We demonstrate a method of on-line determination of the average grain size of polycrystalline silicon (poly-Si) deduced from the melt duration of molten silicon during the phase transformation using an in-situ optical measurement system. Optical measurements revealed that the entire phase transformation processes are melting, nucleation, and resolidification. The average grain size of poly-Si can be directly deduced from the melt duration of molten Si under a thickness uniformity of precursor a-Si thin films below ±5%, a pulse-to-pulse variation in the excimer-laser-beam energy below 2% (standard deviation), and a laser-beam spatial homogeneity below 2.5%.

Keywords

optical measurements grain size polycrystalline silicon melt duration 

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Copyright information

© Springer Science+Business Media, Inc. 2011

Authors and Affiliations

  1. 1.Department of Mechanical EngineeringMing Chi University of TechnologyNew Taipei CityTaiwan

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